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Kin P Cheung

Showing results (11-20 of 19) with videos related to

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Advanced Functional Materials|May 14, 2019
Ferroelectricity in Polar Polymer-based FETs: A Hysteresis AnalysisVasileia Georgiou, Dmitry Veksler, Jason P Campbell, et al.
Advanced Functional Materials|October 24, 2024
Highly Efficient Rapid Annealing of Thin Polar Polymer Film Ferroelectric Devices at Sub-Glass Transition TemperatureVasileia Georgiou, Dmitry Veksler, Jason T Ryan, et al.
IEEE Transactions on Electron Devices|June 6, 2017
Rapid and Accurate C-V MeasurementsJi-Hong Kim, Pragya R Shrestha, Jason P Campbell, et al.
Analytical Chemistry|April 14, 2015
Electron spin resonance scanning probe spectroscopy for ultrasensitive biochemical studiesJason P Campbell, Jason T Ryan, Pragya R Shrestha, et al.
Analytical Chemistry|August 6, 2019
Nonresonant Transmission Line Probe for Sensitive Interferometric Electron Spin Resonance DetectionPragya R Shrestha, Nandita Abhyankar, Mark A Anders, et al.
IEEE Transactions on Device and Materials Reliability : a Publication of the IEEE Electron Devices Society and the IEEE Reliability Society|April 16, 2019
Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing StationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
The Review of Scientific Instruments|February 3, 2019
Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing stationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society|September 12, 2017
Impact of RRAM Read Fluctuations on the Program-Verify ApproachDavid M Nminibapiel, Dmitry Veksler, J-H Kim, et al.
AIP Advances|November 25, 2016
Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low EnergyCanute I Vaz, Changze Liu, Jason P Campbell, et al.
Pageof 2

Showing results (11-20 of 19) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 19 results.
Advanced Functional Materials|May 14, 2019
Ferroelectricity in Polar Polymer-based FETs: A Hysteresis AnalysisVasileia Georgiou, Dmitry Veksler, Jason P Campbell, et al.
Advanced Functional Materials|October 24, 2024
Highly Efficient Rapid Annealing of Thin Polar Polymer Film Ferroelectric Devices at Sub-Glass Transition TemperatureVasileia Georgiou, Dmitry Veksler, Jason T Ryan, et al.
IEEE Transactions on Electron Devices|June 6, 2017
Rapid and Accurate C-V MeasurementsJi-Hong Kim, Pragya R Shrestha, Jason P Campbell, et al.
Analytical Chemistry|April 14, 2015
Electron spin resonance scanning probe spectroscopy for ultrasensitive biochemical studiesJason P Campbell, Jason T Ryan, Pragya R Shrestha, et al.
Analytical Chemistry|August 6, 2019
Nonresonant Transmission Line Probe for Sensitive Interferometric Electron Spin Resonance DetectionPragya R Shrestha, Nandita Abhyankar, Mark A Anders, et al.
IEEE Transactions on Device and Materials Reliability : a Publication of the IEEE Electron Devices Society and the IEEE Reliability Society|April 16, 2019
Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing StationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
The Review of Scientific Instruments|February 3, 2019
Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing stationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society|September 12, 2017
Impact of RRAM Read Fluctuations on the Program-Verify ApproachDavid M Nminibapiel, Dmitry Veksler, J-H Kim, et al.
AIP Advances|November 25, 2016
Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low EnergyCanute I Vaz, Changze Liu, Jason P Campbell, et al.
Pageof 2