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Journal of Microscopy|May 28, 2008
Compositional analysis of mixed-cation-anion III-V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopyK Mahalingam, K G Eyink, G J Brown, et al.Nanomaterials (Basel, Switzerland)|March 29, 2023
Probing the Boundary between Classical and Quantum Mechanics by Analyzing the Energy Dependence of Single-Electron Scattering Events at the NanoscaleChristian Kisielowski, Petra Specht, Stig Helveg, et al.Clinical Oral Investigations|March 7, 2018
Investigation of clinicopathological parameters and expression of COX-2, bcl-2, PCNA, and p53 in primary and recurrent sporadic odontogenic keratocystsTomasz Kaczmarzyk, Konrad Kisielowski, Rafał Koszowski, et al.Small (Weinheim an Der Bergstrasse, Germany)|March 27, 2012
Atomic structural analysis of nanowire defects and polytypes enabled through cross-sectional lattice imagingEric R Hemesath, Daniel K Schreiber, Christian F Kisielowski, et al.Science (New York, N.Y.)|December 4, 2004
Interface structure and atomic bonding characteristics in silicon nitride ceramicsA Ziegler, J C Idrobo, M K Cinibulk, et al.Nanoscale|September 16, 2015
Polyvinylidene fluoride molecules in nanofibers, imaged at atomic scale by aberration corrected electron microscopyDinesh Lolla, Joseph Gorse, Christian Kisielowski, et al.Physical Review Letters|November 24, 2011
Understanding the metal-carbon interface in FePt catalyzed carbon nanotubesD Pohl, F Schäffel, M H Rümmeli, et al.Nature Communications|November 2, 2013
Atomically perfect torn graphene edges and their reversible reconstructionKwanpyo Kim, Sinisa Coh, C Kisielowski, et al.Micron (Oxford, England : 1993)|August 26, 2014
Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopyC Kisielowski, P Specht, S M Gygax, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 31, 2004
Thin dielectric film thickness determination by advanced transmission electron microscopyA C Diebold, B Foran, C Kisielowski, et al.Pageof 7