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Klaus Bobey

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Applied Optics|October 13, 2007

Dual-wavelength vertical scanning low-coherence interferometric microscopeJan Niehues, Peter Lehmann, Klaus Bobey

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Applied Optics|October 13, 2007

Dual-wavelength vertical scanning low-coherence interferometric microscopeJan Niehues, Peter Lehmann, Klaus Bobey

Pageof 1