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Beilstein Journal of Nanotechnology|November 26, 2025
Calibration of piezo actuators and systems by dynamic interferometryKnarik Khachatryan, Michael ReichlingThe Review of Scientific Instruments|September 3, 2025
Highly accurate adjustment and stabilization of a fiber interferometer for displacement measurementsAlexander von Schmidsfeld, Knarik Khachatryan, Michael ReichlingBeilstein Journal of Nanotechnology|August 27, 2024
Signal generation in dynamic interferometric displacement detectionKnarik Khachatryan, Simon Anter, Michael Reichling, et al.Physical Chemistry Chemical Physics : PCCP|July 23, 2011
Characterizing TiO2(110) surface states by their work functionAndriy Borodin, Michael ReichlingBeilstein Journal of Nanotechnology|April 26, 2019
Capillary force-induced superlattice variation atop a nanometer-wide graphene flake and its moiré origin studied by STMLoji K Thomas, Michael ReichlingBeilstein Journal of Nanotechnology|October 8, 2020
Protruding hydrogen atoms as markers for the molecular orientation of a metalloceneLinda Laflör, Michael Reichling, Philipp RaheChemical Communications (Cambridge, England)|August 16, 2011
Steering molecular island morphology on an insulator surface by exploiting sequential depositionFelix Loske, Michael Reichling, Angelika KühnleBeilstein Journal of Nanotechnology|July 1, 2025
Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surfaceBob Kyeyune, Philipp Rahe, Michael ReichlingBeilstein Journal of Nanotechnology|February 2, 2017
Noise in NC-AFM measurements with significant tip-sample interactionJannis Lübbe, Matthias Temmen, Philipp Rahe, et al.The Review of Scientific Instruments|February 12, 2024
Determination of in-plane surface directions in scanning probe microscopy imagesBob Kyeyune, Reinhard Olbrich, Philipp Rahe, et al.Pageof 3