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Applied Optics|March 18, 2003
Simulation of the depolarization effect in porous siliconKyung Hoon Jun, Koeng Su LimJournal of the Optical Society of America. A, Optics, Image Science, and Vision|June 13, 2003
Simulation of depolarization effect by a rough surface for spectroscopic ellipsometryKyung Hoon Jun, Joong Hwan Kwak, Koeng Su LimNanoscale|May 11, 2011
Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopySeung Jae Baik, Koeng Su Lim, Wonsup Choi, et al.Pageof 1