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Koh Saitoh

Showing results (1-10 of 33) with videos related to

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Microscopy (Oxford, England)|February 14, 2023
Measurement and correction of TEM image distortion using arbitrary samplesHirokazu Tamaki, Koh Saitoh
Microscopy (Oxford, England)|July 25, 2024
Near-field electron ptychography using full-field structured illuminationHirokazu Tamaki, Koh Saitoh
Microscopy (Oxford, England)|April 20, 2013
Improvement of the precision of lattice parameter determination by nano-beam electron diffractionKoh Saitoh, Hirotaka Nakahara, Nobuo Tanaka
Microscopy (Oxford, England)|October 4, 2023
Phase retrieval of electron rocking curves using total variation and total squared variation regularizationsAkihiro Shichi, Hiroyuki Ishizuka, Koh Saitoh
Journal of Electron Microscopy|February 17, 2007
Observation of the anisotropy of the inelastic scattering of fast electrons accompanied by the K-shell ionization of a carbon nanotubeKoh Saitoh, Keisuke Nagasaka, Nobuo Tanaka
Journal of Electron Microscopy|April 27, 2010
Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probeKoh Saitoh, Yoshihide Tatara, Nobuo Tanaka
Journal of Electron Microscopy|March 8, 2012
Production of electron vortex beams carrying large orbital angular momentum using spiral zone platesKoh Saitoh, Yuya Hasegawa, Nobuo Tanaka, et al.
Microscopy (Oxford, England)|June 23, 2017
Nearly nondiffracting electron lattice beams generated by polygonal slitsHiroki Nambu, Yuuki Noguchi, Koh Saitoh, et al.
Optics Express|September 13, 2019
Creating electron phase holograms using femtosecond laser interference processingYuuki Uesugi, Ryota Fukushima, Koh Saitoh, et al.
Nano Letters|August 10, 2006
Direct observation of six-membered rings in the upper and lower walls of a single-wall carbon nanotube by spherical aberration-corrected HRTEMKaori Hirahara, Koh Saitoh, Jun Yamasaki, et al.
Pageof 4

Showing results (1-10 of 33) with videos related to

Sort By:
Pageof 4
Microscopy (Oxford, England)|February 14, 2023
Measurement and correction of TEM image distortion using arbitrary samplesHirokazu Tamaki, Koh Saitoh
Microscopy (Oxford, England)|July 25, 2024
Near-field electron ptychography using full-field structured illuminationHirokazu Tamaki, Koh Saitoh
Microscopy (Oxford, England)|April 20, 2013
Improvement of the precision of lattice parameter determination by nano-beam electron diffractionKoh Saitoh, Hirotaka Nakahara, Nobuo Tanaka
Microscopy (Oxford, England)|October 4, 2023
Phase retrieval of electron rocking curves using total variation and total squared variation regularizationsAkihiro Shichi, Hiroyuki Ishizuka, Koh Saitoh
Journal of Electron Microscopy|February 17, 2007
Observation of the anisotropy of the inelastic scattering of fast electrons accompanied by the K-shell ionization of a carbon nanotubeKoh Saitoh, Keisuke Nagasaka, Nobuo Tanaka
Journal of Electron Microscopy|April 27, 2010
Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probeKoh Saitoh, Yoshihide Tatara, Nobuo Tanaka
Journal of Electron Microscopy|March 8, 2012
Production of electron vortex beams carrying large orbital angular momentum using spiral zone platesKoh Saitoh, Yuya Hasegawa, Nobuo Tanaka, et al.
Microscopy (Oxford, England)|June 23, 2017
Nearly nondiffracting electron lattice beams generated by polygonal slitsHiroki Nambu, Yuuki Noguchi, Koh Saitoh, et al.
Optics Express|September 13, 2019
Creating electron phase holograms using femtosecond laser interference processingYuuki Uesugi, Ryota Fukushima, Koh Saitoh, et al.
Nano Letters|August 10, 2006
Direct observation of six-membered rings in the upper and lower walls of a single-wall carbon nanotube by spherical aberration-corrected HRTEMKaori Hirahara, Koh Saitoh, Jun Yamasaki, et al.
Pageof 4