Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Kousuke Ooe
Alireza Sadri
Scott D Findlay

Showing results (1-10 of 79) with videos related to

Pageof 8
Sort By:
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 12, 2025
Optimizing Structure Factors From Four-dimensional Scanning Transmission Electron Microscopy via the Scattering MatrixKousuke Ooe, Alireza Sadri, Scott D Findlay
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Determining the Projected Crystal Structure from Four-dimensional Scanning Transmission Electron Microscopy via the Scattering MatrixAlireza Sadri, Scott D Findlay
Small Methods|May 18, 2026
Enhancing Dose Efficiency of Optimum Bright-Field Scanning Transmission Electron Microscopy Using a Phase-Shifted Electron ProbeMitsuru Nogami, Takehito Seki, Kousuke Ooe, et al.
Ultramicroscopy|May 5, 2019
High contrast STEM imaging for light elements by an annular segmented detectorKousuke Ooe, Takehito Seki, Yuichi Ikuhara, et al.
Microscopy (Oxford, England)|January 16, 2024
Artifactual atomic displacements on surfaces using annular dark-field images with image simulationShunsuke Kobayashi, Kousuke Ooe, Kei Nakayama, et al.
Ultramicroscopy|November 12, 2020
Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratioKousuke Ooe, Takehito Seki, Yuichi Ikuhara, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 10, 2025
Quantitative Structure Determination from Experimental Four-Dimensional Scanning Transmission Electron Microscopy via the Scattering MatrixEmmanuel W C Terzoudis-Lumsden, Alireza Sadri, Matthew Weyland, et al.
Microscopy (Oxford, England)|November 7, 2024
Dose-efficient phase-contrast imaging of thick weak phase objects via OBF STEM using a pixelated detectorKousuke Ooe, Takehito Seki, Mitsuru Nogami, et al.
Acta Crystallographica. Section D, Structural Biology|August 16, 2023
A Python package based on robust statistical analysis for serial crystallography data processingMarjan Hadian-Jazi, Alireza Sadri
Frontiers in Physiology|December 11, 2012
How parts make up wholesScott D Findlay, Paul Thagard
Pageof 8

Showing results (1-10 of 79) with videos related to

Sort By:
Pageof 8
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 12, 2025
Optimizing Structure Factors From Four-dimensional Scanning Transmission Electron Microscopy via the Scattering MatrixKousuke Ooe, Alireza Sadri, Scott D Findlay
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Determining the Projected Crystal Structure from Four-dimensional Scanning Transmission Electron Microscopy via the Scattering MatrixAlireza Sadri, Scott D Findlay
Small Methods|May 18, 2026
Enhancing Dose Efficiency of Optimum Bright-Field Scanning Transmission Electron Microscopy Using a Phase-Shifted Electron ProbeMitsuru Nogami, Takehito Seki, Kousuke Ooe, et al.
Ultramicroscopy|May 5, 2019
High contrast STEM imaging for light elements by an annular segmented detectorKousuke Ooe, Takehito Seki, Yuichi Ikuhara, et al.
Microscopy (Oxford, England)|January 16, 2024
Artifactual atomic displacements on surfaces using annular dark-field images with image simulationShunsuke Kobayashi, Kousuke Ooe, Kei Nakayama, et al.
Ultramicroscopy|November 12, 2020
Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratioKousuke Ooe, Takehito Seki, Yuichi Ikuhara, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 10, 2025
Quantitative Structure Determination from Experimental Four-Dimensional Scanning Transmission Electron Microscopy via the Scattering MatrixEmmanuel W C Terzoudis-Lumsden, Alireza Sadri, Matthew Weyland, et al.
Microscopy (Oxford, England)|November 7, 2024
Dose-efficient phase-contrast imaging of thick weak phase objects via OBF STEM using a pixelated detectorKousuke Ooe, Takehito Seki, Mitsuru Nogami, et al.
Acta Crystallographica. Section D, Structural Biology|August 16, 2023
A Python package based on robust statistical analysis for serial crystallography data processingMarjan Hadian-Jazi, Alireza Sadri
Frontiers in Physiology|December 11, 2012
How parts make up wholesScott D Findlay, Paul Thagard
Pageof 8