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Journal of Microscopy|March 13, 2014
Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscopeL Jones, P D NellistJournal of Microscopy|January 10, 2018
An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-fieldL Jones, A Varambhia, H Sawada, et al.Nature Communications|June 5, 2015
Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioningH Yang, J G Lozano, T J Pennycook, et al.Ultramicroscopy|February 20, 2007
A Bloch wave analysis of optical sectioning in aberration-corrected STEME C Cosgriff, P D NellistUltramicroscopy|August 31, 2015
Quantitative STEM normalisation: The importance of the electron fluxG T Martinez, L Jones, A De Backer, et al.Nanoscale|June 17, 2017
Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunitiesA De Backer, L Jones, I Lobato, et al.Ultramicroscopy|December 17, 2014
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-countingA De Backer, G T Martinez, K E MacArthur, et al.Journal of Electron Microscopy|July 27, 2001
On the origin of transverse incoherence in Z-contrast STEMB Rafferty, P D Nellist, S J PennycookMicron (Oxford, England : 1993)|August 5, 2003
Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectraI Arslan, S Ogut, P D Nellist, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscopeP D Nellist, E C Cosgriff, G Behan, et al.Pageof 903