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Analytical Chemistry|December 21, 2019
Fluorine Gas Coinjection as a Solution for Enhancing Spatial Resolution of Time-of-Flight Secondary Ion Mass Spectrometry and Separating Mass InterferenceAgnieszka Priebe, Laszlo Pethö, Johann Michler
Analytical Chemistry|August 21, 2019
Application of a Gas-Injection System during the FIB-TOF-SIMS Analysis-Influence of Water Vapor and Fluorine Gas on Secondary Ion Signals and Sputtering RatesAgnieszka Priebe, Ivo Utke, Laszlo Pethö, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|January 13, 2023
Room Temperature Viscous Flow of Amorphous Silica Induced by Electron Beam IrradiationSebastian Bruns, Christian Minnert, Laszlo Pethö, et al.
Analytical Chemistry|July 14, 2021
Mechanisms of Fluorine-Induced Separation of Mass Interference during TOF-SIMS AnalysisAgnieszka Priebe, Emese Huszar, Marek Nowicki, et al.
ACS Applied Materials & Interfaces|March 26, 2021
High Sensitivity of Fluorine Gas-Assisted FIB-TOF-SIMS for Chemical Characterization of Buried Sublayers in Thin FilmsAgnieszka Priebe, Laszlo Pethö, Emese Huszar, et al.
Nanoscale|May 10, 2023
From metal nanowires to ultrathin crystalline ALD nanotubes: process development and mechanism revealed by in situ TEM heating experimentsLilian Maria Vogl, Peter Schweizer, Laszlo Pethö, et al.
Beilstein Journal of Nanotechnology|June 9, 2020
A set of empirical equations describing the observed colours of metal-anodic aluminium oxide-Al nanostructuresCristina V Manzano, Jakob J Schwiedrzik, Gerhard Bürki, et al.
Analytical Chemistry|August 19, 2020
Elemental Characterization of Al Nanoparticles Buried under a Cu Thin Film: TOF-SIMS vs STEM/EDXAgnieszka Priebe, Jean-Paul Barnes, Thomas Edward James Edwards, et al.
Nature Communications|November 22, 2023
Atomic scale volume and grain boundary diffusion elucidated by in situ STEMPeter Schweizer, Amit Sharma, Laszlo Pethö, et al.
Analytical Chemistry|August 21, 2019
3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDXAgnieszka Priebe, Jean-Paul Barnes, Thomas Edward James Edwards, et al.
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