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Lewys Jones

Showing results (1-10 of 47) with videos related to

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Journal of Microscopy|November 21, 2017
Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM-XX)Thomas Walther, Lewys Jones
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D Nellist
Micron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D Nellist
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 18, 2020
Development of a Practicable Digital Pulse Read-Out for Dark-Field STEMTiarnan Mullarkey, Clive Downing, Lewys Jones
Scientific Reports|May 13, 2025
Rapid eigenpatch utility classifier for image denoisingMichael A J Mitchell, Stefano Sanvito, Lewys Jones
Microscopy (Oxford, England)|May 12, 2026
Dynamic Scan Shaping: Overcoming Coil Hysteresis for High-Speed STEMJonathan J P Peters, Grigore Moldovan, Lewys Jones
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron MicroscopeFrances Quigley, Clive Downing, Cormac McGuinness, et al.
Micron (Oxford, England : 1993)|March 11, 2017
Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopySigurd Wenner, Lewys Jones, Calin D Marioara, et al.
Advanced Structural and Chemical Imaging|June 23, 2018
Maximising the resolving power of the scanning tunneling microscopeLewys Jones, Shuqiu Wang, Xiao Hu, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 31, 2022
Cost and Capability Compromises in STEM Instrumentation for Low-Voltage ImagingFrances Quigley, Patrick McBean, Peter O'Donovan, et al.
Pageof 5

Showing results (1-10 of 47) with videos related to

Sort By:
Pageof 5
Journal of Microscopy|November 21, 2017
Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM-XX)Thomas Walther, Lewys Jones
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D Nellist
Micron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D Nellist
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 18, 2020
Development of a Practicable Digital Pulse Read-Out for Dark-Field STEMTiarnan Mullarkey, Clive Downing, Lewys Jones
Scientific Reports|May 13, 2025
Rapid eigenpatch utility classifier for image denoisingMichael A J Mitchell, Stefano Sanvito, Lewys Jones
Microscopy (Oxford, England)|May 12, 2026
Dynamic Scan Shaping: Overcoming Coil Hysteresis for High-Speed STEMJonathan J P Peters, Grigore Moldovan, Lewys Jones
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron MicroscopeFrances Quigley, Clive Downing, Cormac McGuinness, et al.
Micron (Oxford, England : 1993)|March 11, 2017
Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopySigurd Wenner, Lewys Jones, Calin D Marioara, et al.
Advanced Structural and Chemical Imaging|June 23, 2018
Maximising the resolving power of the scanning tunneling microscopeLewys Jones, Shuqiu Wang, Xiao Hu, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 31, 2022
Cost and Capability Compromises in STEM Instrumentation for Low-Voltage ImagingFrances Quigley, Patrick McBean, Peter O'Donovan, et al.
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