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Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
July 4, 2012
Mask optimization approaches in optical lithography based on a vector imaging model
Xu Ma, Yanqiu Li, Lisong Dong
Applied Optics
|
April 3, 2024
Method for optical proximity correction based on a vector imaging model
Ruixuan Wu, Lisong Dong, Yayi Wei
Applied Optics
|
April 3, 2024
SCAPSM: attenuated phase-shift mask structure for EUV lithography
Chen Li, Lisong Dong, Yayi Wei
Optics Express
|
October 7, 2021
Compensation of EUV lithography mask blank defect based on an advanced genetic algorithm
Ruixuan Wu, Lisong Dong, Xu Ma, et al.
Optics Express
|
November 22, 2024
LIC-CGAN: fast lithography latent images calculation method for large-area masks using deep learning
Yihan Zhao, Lisong Dong, Ziqi Li, et al.
Applied Optics
|
October 19, 2023
Aberration budget analysis of EUV lithography from the imaging performance of a contact layer in a 5 nm technology node
Zhishu Chen, Lisong Dong, Huwen Ding, et al.
Optics Express
|
June 29, 2023
Decomposition-learning-based thick-mask model for partially coherent lithography system
Ziqi Li, Lisong Dong, Xu Ma, et al.
Applied Optics
|
March 10, 2021
Aberration optimization in an extreme ultraviolet lithography projector via a BP neural network and simulated annealing algorithm
Rongbo Zhao, Lisong Dong, Rui Chen, et al.
The Review of Scientific Instruments
|
September 5, 2025
Target recognition and grasping strategies for soft robotic manipulators in unstructured environments
Lisong Dong, Huiru Zhu, Yuan Chen, et al.
Micromachines
|
November 27, 2025
A Two-Stage Unet Framework for Sub-Resolution Assist Feature Prediction
Mu Lin, Le Ma, Lisong Dong, et al.
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of 6
Search research articles
Search
Showing results (1-10 of 51) with videos related to
Sort By:
Page
of 6
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
July 4, 2012
Mask optimization approaches in optical lithography based on a vector imaging model
Xu Ma, Yanqiu Li, Lisong Dong
Applied Optics
|
April 3, 2024
Method for optical proximity correction based on a vector imaging model
Ruixuan Wu, Lisong Dong, Yayi Wei
Applied Optics
|
April 3, 2024
SCAPSM: attenuated phase-shift mask structure for EUV lithography
Chen Li, Lisong Dong, Yayi Wei
Optics Express
|
October 7, 2021
Compensation of EUV lithography mask blank defect based on an advanced genetic algorithm
Ruixuan Wu, Lisong Dong, Xu Ma, et al.
Optics Express
|
November 22, 2024
LIC-CGAN: fast lithography latent images calculation method for large-area masks using deep learning
Yihan Zhao, Lisong Dong, Ziqi Li, et al.
Applied Optics
|
October 19, 2023
Aberration budget analysis of EUV lithography from the imaging performance of a contact layer in a 5 nm technology node
Zhishu Chen, Lisong Dong, Huwen Ding, et al.
Optics Express
|
June 29, 2023
Decomposition-learning-based thick-mask model for partially coherent lithography system
Ziqi Li, Lisong Dong, Xu Ma, et al.
Applied Optics
|
March 10, 2021
Aberration optimization in an extreme ultraviolet lithography projector via a BP neural network and simulated annealing algorithm
Rongbo Zhao, Lisong Dong, Rui Chen, et al.
The Review of Scientific Instruments
|
September 5, 2025
Target recognition and grasping strategies for soft robotic manipulators in unstructured environments
Lisong Dong, Huiru Zhu, Yuan Chen, et al.
Micromachines
|
November 27, 2025
A Two-Stage Unet Framework for Sub-Resolution Assist Feature Prediction
Mu Lin, Le Ma, Lisong Dong, et al.
Page
of 6