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Luca Panarella

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ACS Applied Nano Materials|December 18, 2025
Charge Transport Regimes of MoS<sub>2</sub> Nanosheets at Cryogenic Temperatures: Implications for Cryogenic ElectronicsMichael D Thompson, Matthew Haworth, Owain T Hughes, et al.
ACS Applied Materials & Interfaces|October 28, 2024
Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETsLuca Panarella, Stanislav Tyaginov, Ben Kaczer, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
ACS Applied Nano Materials|December 18, 2025
Charge Transport Regimes of MoS<sub>2</sub> Nanosheets at Cryogenic Temperatures: Implications for Cryogenic ElectronicsMichael D Thompson, Matthew Haworth, Owain T Hughes, et al.
ACS Applied Materials & Interfaces|October 28, 2024
Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETsLuca Panarella, Stanislav Tyaginov, Ben Kaczer, et al.
Pageof 1