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Lucas J van Vliet

Showing results (1-10 of 81) with videos related to

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IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|February 5, 2008
Curvature of n-dimensional space curves in grey-value imagesBernd Rieger, Lucas J van Vliet
Applied Optics|April 22, 2017
Impact of partial coherence on the apparent optical transfer function derived from the response to amplitude edgesS Mojtaba Shakeri, Lucas J van Vliet, Sjoerd Stallinga
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|August 24, 2010
Multi-frame super-resolution reconstruction of small moving objectsAdam W M van Eekeren, Klamer Schutte, Lucas J van Vliet
IEEE Transactions on Medical Imaging|February 11, 2017
Segmentation of Locally Varying Numbers of Outer Retinal Layers by a Model Selection ApproachJelena Novosel, Suzanne Yzer, Koenraad A Vermeer, et al.
Ultramicroscopy|September 10, 2013
When to use the projection assumption and the weak-phase object approximation in phase contrast cryo-EMMiloš Vulović, Lenard M Voortman, Lucas J van Vliet, et al.
Optics Express|April 4, 2015
Optical quality assessment of whole slide imaging systems for digital pathologyS Mojtaba Shakeri, Bas Hulsken, Lucas J van Vliet, et al.
International Journal of Computer Assisted Radiology and Surgery|January 1, 2018
A hybrid optimization strategy for registering images with large local deformations and intensity variationsZhang Li, Lucas J van Vliet, Jaap Stoker, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|September 22, 2005
Correction for the dislocation of curved surfaces caused by the PSF in 2D and 3D CT imagesHenri Bouma, Anna Vilanova, Lucas J van Vliet, et al.
Optics Express|June 13, 2014
Three-dimensional structured illumination microscopy using Lukosz bound apodization reduces pixel negativity at no resolution costChristiaan H Righolt, Sabine Mai, Lucas J van Vliet, et al.
Ultramicroscopy|June 26, 2012
Fast, spatially varying CTF correction in TEMLenard M Voortman, Erik M Franken, Lucas J van Vliet, et al.
Pageof 9

Showing results (1-10 of 81) with videos related to

Sort By:
Pageof 9
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|February 5, 2008
Curvature of n-dimensional space curves in grey-value imagesBernd Rieger, Lucas J van Vliet
Applied Optics|April 22, 2017
Impact of partial coherence on the apparent optical transfer function derived from the response to amplitude edgesS Mojtaba Shakeri, Lucas J van Vliet, Sjoerd Stallinga
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|August 24, 2010
Multi-frame super-resolution reconstruction of small moving objectsAdam W M van Eekeren, Klamer Schutte, Lucas J van Vliet
IEEE Transactions on Medical Imaging|February 11, 2017
Segmentation of Locally Varying Numbers of Outer Retinal Layers by a Model Selection ApproachJelena Novosel, Suzanne Yzer, Koenraad A Vermeer, et al.
Ultramicroscopy|September 10, 2013
When to use the projection assumption and the weak-phase object approximation in phase contrast cryo-EMMiloš Vulović, Lenard M Voortman, Lucas J van Vliet, et al.
Optics Express|April 4, 2015
Optical quality assessment of whole slide imaging systems for digital pathologyS Mojtaba Shakeri, Bas Hulsken, Lucas J van Vliet, et al.
International Journal of Computer Assisted Radiology and Surgery|January 1, 2018
A hybrid optimization strategy for registering images with large local deformations and intensity variationsZhang Li, Lucas J van Vliet, Jaap Stoker, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|September 22, 2005
Correction for the dislocation of curved surfaces caused by the PSF in 2D and 3D CT imagesHenri Bouma, Anna Vilanova, Lucas J van Vliet, et al.
Optics Express|June 13, 2014
Three-dimensional structured illumination microscopy using Lukosz bound apodization reduces pixel negativity at no resolution costChristiaan H Righolt, Sabine Mai, Lucas J van Vliet, et al.
Ultramicroscopy|June 26, 2012
Fast, spatially varying CTF correction in TEMLenard M Voortman, Erik M Franken, Lucas J van Vliet, et al.
Pageof 9