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Ultramicroscopy|July 19, 2011
High resolution surface morphology measurements using EBSD cross-correlation techniques and AFMM D Vaudin, G Stan, Y B Gerbig, et al.Ultramicroscopy|April 14, 2009
Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imagingG Stan, S Krylyuk, A V Davydov, et al.Nanotechnology|August 10, 2011
Mapping the elastic properties of granular Au films by contact resonance atomic force microscopyG Stan, R F CookPhysical Review. B, Condensed Matter and Materials Physics|March 1, 2016
<i>In situ</i> spectroscopic study of the plastic deformation of amorphous silicon under non-hydrostatic conditions induced by indentationY B Gerbig, C A Michaels, J E Bradby, et al.Nano Letters|May 4, 2010
Compressive stress effect on the radial elastic modulus of oxidized Si nanowiresG Stan, S Krylyuk, A V Davydov, et al.Journal of Research of the National Institute of Standards and Technology|August 9, 2016
Crystallographic Texture in Ceramics and MetalsM D VaudinUltramicroscopy|December 3, 2014
Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on SiM D Vaudin, W A Osborn, L H Friedman, et al.Journal of Non-Crystalline Solids|August 29, 2020
<i>In-situ</i> Raman spectroscopic measurements of the deformation region in indented glassesY B Gerbig, C A MichaelsThe Review of Scientific Instruments|January 3, 2013
Indentation device for in situ Raman spectroscopic and optical studiesY B Gerbig, C A Michaels, A M Forster, et al.Journal of Non-Crystalline Solids|February 5, 2024
Raman spectroscopic measurements and imaging on sub-newton Berkovich and spherical imprints in fused silicaY B Gerbig, Chris A MichaelsPageof 8