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M E Murtagh

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The Review of Scientific Instruments|May 3, 2011
A micro-optical modulation spectroscopy technique for local strain measurementH Chouaib, M E Murtagh, P V Kelly
The Review of Scientific Instruments|December 3, 2008
Rapid photoreflectance spectroscopy for strained silicon metrologyH Chouaib, M E Murtagh, V Guènebaut, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|May 3, 2011
A micro-optical modulation spectroscopy technique for local strain measurementH Chouaib, M E Murtagh, P V Kelly
The Review of Scientific Instruments|December 3, 2008
Rapid photoreflectance spectroscopy for strained silicon metrologyH Chouaib, M E Murtagh, V Guènebaut, et al.
Pageof 1