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M Gorgoi

Showing results (1-10 of 6) with videos related to

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The Review of Scientific Instruments|January 1, 2008
KMC-1: a high resolution and high flux soft x-ray beamline at BESSYF Schaefers, M Mertin, M Gorgoi
Journal of Physics. Condensed Matter : an Institute of Physics Journal|April 4, 2018
Energy shifts in photoemission lines during the tetragonal- to cubic-phase transition in BaTiO<sub>3</sub> single crystals and systems with CoFe<sub>2</sub>O<sub>4</sub> and NiFe<sub>2</sub>O<sub>4</sub> overlayersM Welke, P Huth, K Dabelow, et al.
Scientific Reports|March 16, 2016
Interface Engineering to Create a Strong Spin Filter Contact to SiliconC Caspers, A Gloskovskii, M Gorgoi, et al.
Nature Communications|May 31, 2014
Single bunch X-ray pulses on demand from a multi-bunch synchrotron radiation sourceK Holldack, R Ovsyannikov, P Kuske, et al.
Physical Review Letters|February 7, 2007
Sample preserving deep interface characterization techniqueE Holmström, W Olovsson, I A Abrikosov, et al.
Physical Review Letters|June 13, 2009
Profiling the interface electron gas of LaAlO3/SrTiO3 heterostructures with hard x-ray photoelectron spectroscopyM Sing, G Berner, K Goss, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|January 1, 2008
KMC-1: a high resolution and high flux soft x-ray beamline at BESSYF Schaefers, M Mertin, M Gorgoi
Journal of Physics. Condensed Matter : an Institute of Physics Journal|April 4, 2018
Energy shifts in photoemission lines during the tetragonal- to cubic-phase transition in BaTiO<sub>3</sub> single crystals and systems with CoFe<sub>2</sub>O<sub>4</sub> and NiFe<sub>2</sub>O<sub>4</sub> overlayersM Welke, P Huth, K Dabelow, et al.
Scientific Reports|March 16, 2016
Interface Engineering to Create a Strong Spin Filter Contact to SiliconC Caspers, A Gloskovskii, M Gorgoi, et al.
Nature Communications|May 31, 2014
Single bunch X-ray pulses on demand from a multi-bunch synchrotron radiation sourceK Holldack, R Ovsyannikov, P Kuske, et al.
Physical Review Letters|February 7, 2007
Sample preserving deep interface characterization techniqueE Holmström, W Olovsson, I A Abrikosov, et al.
Physical Review Letters|June 13, 2009
Profiling the interface electron gas of LaAlO3/SrTiO3 heterostructures with hard x-ray photoelectron spectroscopyM Sing, G Berner, K Goss, et al.
Pageof 1