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Journal of Microscopy|April 20, 2019
Electron beam broadening in electron-transparent samples at low electron energiesM Hugenschmidt, E Müller, D Gerthsen
Ultramicroscopy|September 24, 2019
Differential electron scattering cross-sections at low electron energies: The influence of screening parameterM Čalkovský, E Müller, M Hugenschmidt, et al.
Ultramicroscopy|December 13, 2016
Composition quantification of electron-transparent samples by backscattered electron imaging in scanning electron microscopyE Müller, D Gerthsen
Journal of Microscopy|April 19, 2022
Carbon-film-based Zernike phase plates with smooth thickness gradient for phase-contrast transmission electron microscopy with reduced fringing artefactsM Obermair, S Hettler, M Dries, et al.
Ultramicroscopy|December 2, 2017
Electron-beam broadening in amorphous carbon films in low-energy scanning transmission electron microscopyH Drees, E Müller, M Dries, et al.
Journal of Microscopy|March 22, 2014
Backscattered electron SEM imaging of cells and determination of the information depthJ Seiter, E Müller, H Blank, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 17, 2010
Quantification of sample thickness and in-concentration of InGaAs quantum wells by transmission measurements in a scanning electron microscopeT Volkenandt, E Müller, D Z Hu, et al.
Ultramicroscopy|February 22, 2014
A nanocrystalline Hilbert phase-plate for phase-contrast transmission electron microscopyM Dries, S Hettler, B Gamm, et al.
Journal of Microscopy|January 11, 2007
An improved method for angular-resolved characterization of the optical anisotropy of pyrolytic carbonB Reznik, D Gerthsen, E Bortchagovsky
Journal of Microscopy|December 16, 2010
Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determinationM Pfaff, E Müller, M F G Klein, et al.
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