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M J Cordill

Showing results (1-10 of 7) with videos related to

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Thin Solid Films|February 3, 2015
Ductile film delamination from compliant substrates using hard overlayersM J Cordill, V M Marx, C Kirchlechner
Acta Materialia|April 5, 2013
Detailed modelling of delamination buckling of thin films under global tensionF Toth, F G Rammerstorfer, M J Cordill, et al.
MRS Advances|December 4, 2023
Parameters influencing the fracture of Mo films and their wider significanceM J Cordill, P Kreiml, T Jörg, et al.
Thin Solid Films|March 26, 2013
An elevated temperature study of a Ti adhesion layer on polyimideA A Taylor, M J Cordill, L Bowles, et al.
The Review of Scientific Instruments|June 3, 2017
A versatile atomic force microscope integrated with a scanning electron microscopeJ Kreith, T Strunz, E J Fantner, et al.
JOM (Warrendale, Pa. : 1989)|April 9, 2019
Crack Initiation of Printed Lines Predicted with Digital Image CorrelationC Katsarelis, O Glushko, C Tonkin, et al.
Nature Communications|January 5, 2018
Electrically reversible cracks in an intermetallic film controlled by an electric fieldZ Q Liu, J H Liu, M D Biegalski, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Thin Solid Films|February 3, 2015
Ductile film delamination from compliant substrates using hard overlayersM J Cordill, V M Marx, C Kirchlechner
Acta Materialia|April 5, 2013
Detailed modelling of delamination buckling of thin films under global tensionF Toth, F G Rammerstorfer, M J Cordill, et al.
MRS Advances|December 4, 2023
Parameters influencing the fracture of Mo films and their wider significanceM J Cordill, P Kreiml, T Jörg, et al.
Thin Solid Films|March 26, 2013
An elevated temperature study of a Ti adhesion layer on polyimideA A Taylor, M J Cordill, L Bowles, et al.
The Review of Scientific Instruments|June 3, 2017
A versatile atomic force microscope integrated with a scanning electron microscopeJ Kreith, T Strunz, E J Fantner, et al.
JOM (Warrendale, Pa. : 1989)|April 9, 2019
Crack Initiation of Printed Lines Predicted with Digital Image CorrelationC Katsarelis, O Glushko, C Tonkin, et al.
Nature Communications|January 5, 2018
Electrically reversible cracks in an intermetallic film controlled by an electric fieldZ Q Liu, J H Liu, M D Biegalski, et al.
Pageof 1