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M J Treacy

Showing results (41-50 of 47) with videos related to

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Acta Crystallographica. Section A, Foundations and Advances|March 2, 2023
Three-periodic nets, tilings and surfaces. A short review and new resultsOlaf Delgado-Friedrichs, Michael O'Keeffe, Davide M Proserpio, et al.
Physical Review Letters|September 28, 2010
Substantial crystalline topology in amorphous siliconJ M Gibson, M M J Treacy, T Sun, et al.
Journal of Microscopy|February 9, 2007
Fluctuation X-ray microscopy: a novel approach for the structural study of disordered materialsL Fan, D Paterson, I McNulty, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 21, 2014
The importance of averaging to interpret electron correlographs of disordered materialsTao Sun, Michael M J Treacy, Tian Li, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 25, 2025
Rapid-Acquisition Fluctuation Electron Microscopy: Decoherence and the Dominant Role of NoiseArmin Zjajo, Hongchu Du, Rafal E Dunin-Borkowski, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 10, 2015
Speckle Suppression by Decoherence in Fluctuation Electron MicroscopyAram Rezikyan, Zechariah J Jibben, Bryan A Rock, et al.
Physical Review Letters|November 4, 2017
Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous MaterialsS M Collins, R K Leary, P A Midgley, et al.
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Showing results (41-50 of 47) with videos related to

Sort By:
Pageof 5
You have reached the last page of results.This site can display upto 47 results.
Acta Crystallographica. Section A, Foundations and Advances|March 2, 2023
Three-periodic nets, tilings and surfaces. A short review and new resultsOlaf Delgado-Friedrichs, Michael O'Keeffe, Davide M Proserpio, et al.
Physical Review Letters|September 28, 2010
Substantial crystalline topology in amorphous siliconJ M Gibson, M M J Treacy, T Sun, et al.
Journal of Microscopy|February 9, 2007
Fluctuation X-ray microscopy: a novel approach for the structural study of disordered materialsL Fan, D Paterson, I McNulty, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 21, 2014
The importance of averaging to interpret electron correlographs of disordered materialsTao Sun, Michael M J Treacy, Tian Li, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 25, 2025
Rapid-Acquisition Fluctuation Electron Microscopy: Decoherence and the Dominant Role of NoiseArmin Zjajo, Hongchu Du, Rafal E Dunin-Borkowski, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 10, 2015
Speckle Suppression by Decoherence in Fluctuation Electron MicroscopyAram Rezikyan, Zechariah J Jibben, Bryan A Rock, et al.
Physical Review Letters|November 4, 2017
Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous MaterialsS M Collins, R K Leary, P A Midgley, et al.
Pageof 5