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Npj Computational Materials|February 16, 2026
phaser: a unified and extensible framework for fast electron ptychographyColin Gilgenbach, Menglin Zhu, James M LeBeauMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 15, 2024
A Methodology for Robust Multislice PtychographyColin Gilgenbach, Xi Chen, James M LeBeauMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 5, 2022
Towards Augmented Microscopy with Reinforcement Learning-Enhanced WorkflowsMichael Xu, Abinash Kumar, James M LeBeauPhysical Review Letters|March 8, 2024
Modeling Temperature-Dependent Electron Thermal Diffuse Scattering via Machine-Learned Interatomic Potentials and Path-Integral Molecular DynamicsDennis S Kim, Michael Xu, James M LeBeauUltramicroscopy|September 9, 2017
Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopyW Xu, J H Dycus, J M LeBeauMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 18, 2014
Atom column indexing: atomic resolution image analysis through a matrix representationXiahan Sang, Adedapo A Oni, James M LeBeauMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 27, 2025
Optimizing Atomic Number Contrast in Multislice Electron PtychographyBridget R Denzer, Colin Gilgenbach, James M LeBeauUltramicroscopy|November 21, 2022
A comparison of molecular dynamics potentials used to account for thermal diffuse scattering in multislice simulationsXi Chen, Dennis S Kim, James M LeBeauTransplantation|June 1, 1983
Characterization of donor-derived lymphocytes in chimeric rabbitsL T Adler, M M LeBeau, F L AdlerNano Letters|April 15, 2025
Quantifying Implantation-Induced Damage and Point Defects with Multislice Electron PtychographyJunghwa Kim, Colin Gilgenbach, Aaditya Bhat, et al.Pageof 16