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M Lentzen

Showing results (1-10 of 7) with videos related to

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Ultramicroscopy|November 13, 2013
No surprise in the first Born approximation for electron scatteringM Lentzen
Ultramicroscopy|May 20, 2004
The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imagingM Lentzen
Ultramicroscopy|December 25, 2016
The refractive index in electron microscopy and the errors of its approximationsM Lentzen
Ultramicroscopy|June 7, 2012
Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave functionM Lentzen, K Urban
Ultramicroscopy|November 15, 2011
Effective object planes for aberration-corrected transmission electron microscopyR Yu, M Lentzen, J Zhu
Science (New York, N.Y.)|February 8, 2003
Atomic-resolution imaging of oxygen in perovskite ceramicsC L Jia, M Lentzen, K Urban
Ultramicroscopy|September 6, 2002
High-resolution imaging with an aberration-corrected transmission electron microscopeM Lentzen, B Jahnen, C L Jia, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|November 13, 2013
No surprise in the first Born approximation for electron scatteringM Lentzen
Ultramicroscopy|May 20, 2004
The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imagingM Lentzen
Ultramicroscopy|December 25, 2016
The refractive index in electron microscopy and the errors of its approximationsM Lentzen
Ultramicroscopy|June 7, 2012
Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave functionM Lentzen, K Urban
Ultramicroscopy|November 15, 2011
Effective object planes for aberration-corrected transmission electron microscopyR Yu, M Lentzen, J Zhu
Science (New York, N.Y.)|February 8, 2003
Atomic-resolution imaging of oxygen in perovskite ceramicsC L Jia, M Lentzen, K Urban
Ultramicroscopy|September 6, 2002
High-resolution imaging with an aberration-corrected transmission electron microscopeM Lentzen, B Jahnen, C L Jia, et al.
Pageof 1