Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

M Malac

Showing results (1-10 of 8) with videos related to

Pageof 1
Sort By:
Ultramicroscopy|July 26, 2002
Improved background-fitting algorithms for ionization edges in electron energy-loss spectraR F Egerton, M Malac
Micron (Oxford, England : 1993)|December 27, 2005
Improving the energy resolution of X-ray and electron energy-loss spectraR F Egerton, H Qian, M Malac
Ultramicroscopy|May 2, 2001
Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imagingY Zhu, R F Egerton, M Malac
Micron (Oxford, England : 1993)|March 31, 2023
Transmission electron microscopy of thick polymer and biological specimensR F Egerton, M Hayashida, M Malac
Micron (Oxford, England : 1993)|May 4, 2004
Radiation damage in the TEM and SEMR F Egerton, P Li, M Malac
Microscopy Research and Technique|July 22, 2014
Validity of the dipole approximation in TEM-EELS studiesR F Egerton, R A Mcleod, M Malac
Microscopy Research and Technique|April 4, 2017
Quality evaluation of ultra-thin samples: Application to grapheneK Cui, K Bosnick, R Indoe, et al.
Micron (Oxford, England : 1993)|November 27, 2007
Fourier-ratio deconvolution and its Bayesian equivalentR F Egerton, F Wang, M Malac, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|July 26, 2002
Improved background-fitting algorithms for ionization edges in electron energy-loss spectraR F Egerton, M Malac
Micron (Oxford, England : 1993)|December 27, 2005
Improving the energy resolution of X-ray and electron energy-loss spectraR F Egerton, H Qian, M Malac
Ultramicroscopy|May 2, 2001
Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imagingY Zhu, R F Egerton, M Malac
Micron (Oxford, England : 1993)|March 31, 2023
Transmission electron microscopy of thick polymer and biological specimensR F Egerton, M Hayashida, M Malac
Micron (Oxford, England : 1993)|May 4, 2004
Radiation damage in the TEM and SEMR F Egerton, P Li, M Malac
Microscopy Research and Technique|July 22, 2014
Validity of the dipole approximation in TEM-EELS studiesR F Egerton, R A Mcleod, M Malac
Microscopy Research and Technique|April 4, 2017
Quality evaluation of ultra-thin samples: Application to grapheneK Cui, K Bosnick, R Indoe, et al.
Micron (Oxford, England : 1993)|November 27, 2007
Fourier-ratio deconvolution and its Bayesian equivalentR F Egerton, F Wang, M Malac, et al.
Pageof 1