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Analytical Chemistry
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March 14, 2009
Developing repeatable measurements for reliable analysis of molecules at surfaces using desorption electrospray ionization
F M Green, P Stokes, C Hopley, et al.
Analytical Chemistry
|
December 5, 2009
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions
J L S Lee, S Ninomiya, J Matsuo, et al.
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Search research articles
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Showing results (11-20 of 12) with videos related to
Sort By:
Page
of 2
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This site can display upto 12 results.
Analytical Chemistry
|
March 14, 2009
Developing repeatable measurements for reliable analysis of molecules at surfaces using desorption electrospray ionization
F M Green, P Stokes, C Hopley, et al.
Analytical Chemistry
|
December 5, 2009
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions
J L S Lee, S Ninomiya, J Matsuo, et al.
Page
of 2