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M P Valdivia

Showing results (1-10 of 13) with videos related to

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Applied Optics|May 14, 2015
Single-shot Z(eff) dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot-Lau x-ray moiré deflectometerM P Valdivia, D Stutman, M Finkenthal
The Review of Scientific Instruments|August 3, 2014
Moiré deflectometry using the Talbot-Lau interferometer as refraction diagnostic for high energy density plasmas at energies below 10 keVM P Valdivia, D Stutman, M Finkenthal
The Review of Scientific Instruments|October 5, 2010
Fast plasma discharge capillary design as a high power throughput soft x-ray emission sourceE S Wyndham, M Favre, M P Valdivia, et al.
Applied Optics|September 25, 2020
Proof-of-concept Talbot-Lau x-ray interferometry with a high-intensity, high-repetition-rate, laser-driven K-alpha sourceV Bouffetier, L Ceurvorst, M P Valdivia, et al.
The Review of Scientific Instruments|March 3, 2016
An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnosticsM P Valdivia, D Stutman, C Stoeckl, et al.
Optics Express|June 14, 2025
Referenceless, grating-based, single shot X-ray phase contrast imaging with optimized laser-driven K-α sourcesV Bouffetier, G Pérez-Callejo, D Stutman, et al.
The Review of Scientific Instruments|March 2, 2020
Implementation of a Talbot-Lau x-ray deflectometer diagnostic platform for the OMEGA EP laserM P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments|December 3, 2016
Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)M P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments|December 3, 2022
Current advances on Talbot-Lau x-ray imaging diagnostics for high energy density experiments (invited)M P Valdivia, G Perez-Callejo, V Bouffetier, et al.
The Review of Scientific Instruments|November 8, 2018
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometryM P Valdivia, F Veloso, D Stutman, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Applied Optics|May 14, 2015
Single-shot Z(eff) dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot-Lau x-ray moiré deflectometerM P Valdivia, D Stutman, M Finkenthal
The Review of Scientific Instruments|August 3, 2014
Moiré deflectometry using the Talbot-Lau interferometer as refraction diagnostic for high energy density plasmas at energies below 10 keVM P Valdivia, D Stutman, M Finkenthal
The Review of Scientific Instruments|October 5, 2010
Fast plasma discharge capillary design as a high power throughput soft x-ray emission sourceE S Wyndham, M Favre, M P Valdivia, et al.
Applied Optics|September 25, 2020
Proof-of-concept Talbot-Lau x-ray interferometry with a high-intensity, high-repetition-rate, laser-driven K-alpha sourceV Bouffetier, L Ceurvorst, M P Valdivia, et al.
The Review of Scientific Instruments|March 3, 2016
An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnosticsM P Valdivia, D Stutman, C Stoeckl, et al.
Optics Express|June 14, 2025
Referenceless, grating-based, single shot X-ray phase contrast imaging with optimized laser-driven K-α sourcesV Bouffetier, G Pérez-Callejo, D Stutman, et al.
The Review of Scientific Instruments|March 2, 2020
Implementation of a Talbot-Lau x-ray deflectometer diagnostic platform for the OMEGA EP laserM P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments|December 3, 2016
Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)M P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments|December 3, 2022
Current advances on Talbot-Lau x-ray imaging diagnostics for high energy density experiments (invited)M P Valdivia, G Perez-Callejo, V Bouffetier, et al.
The Review of Scientific Instruments|November 8, 2018
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometryM P Valdivia, F Veloso, D Stutman, et al.
Pageof 2