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Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

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M R Howells

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Science (New York, N.Y.)|May 15, 1992

High-Resolution Imaging by Fourier Transform X-ray HolographyI McNulty, J Kirz, C Jacobsen, et al.

Ultramicroscopy|April 11, 2002

Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulationU Weierstall, Q Chen, J C Spence, et al.

Physical Review Letters|October 15, 2008

Tomographic femtosecond x-ray diffractive imagingK E Schmidt, J C H Spence, U Weierstall, et al.

Journal of Electron Spectroscopy and Related Phenomena|September 28, 2011

An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopyM R Howells, T Beetz, H N Chapman, et al.

Physical Review Letters|September 4, 2008

Three-dimensional coherent x-ray diffraction imaging of a ceramic nanofoam: determination of structural deformation mechanismsA Barty, S Marchesini, H N Chapman, et al.

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Search research articles

Showing results (11-20 of 15) with videos related to

Sort By:

Pageof 2

You have reached the last page of results.This site can display upto 15 results.

Science (New York, N.Y.)|May 15, 1992

High-Resolution Imaging by Fourier Transform X-ray HolographyI McNulty, J Kirz, C Jacobsen, et al.

Ultramicroscopy|April 11, 2002

Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulationU Weierstall, Q Chen, J C Spence, et al.

Physical Review Letters|October 15, 2008

Tomographic femtosecond x-ray diffractive imagingK E Schmidt, J C H Spence, U Weierstall, et al.

Journal of Electron Spectroscopy and Related Phenomena|September 28, 2011

An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopyM R Howells, T Beetz, H N Chapman, et al.

Physical Review Letters|September 4, 2008

Three-dimensional coherent x-ray diffraction imaging of a ceramic nanofoam: determination of structural deformation mechanismsA Barty, S Marchesini, H N Chapman, et al.

Pageof 2