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The Review of Scientific Instruments|December 3, 2008
A new procedure for the quantitative analysis of extended x-ray absorption fine structure data in total reflection geometryF Benzi, I Davoli, M Rovezzi, et al.The Review of Scientific Instruments|July 2, 2009
Setup for optimized grazing incidence x-ray absorption experiments on thin films on substratesC Maurizio, M Rovezzi, F Bardelli, et al.Dalton Transactions (Cambridge, England : 2003)|August 20, 2016
Intramolecular Hgπ interactions of d-character with non-bridging atoms in mercury-aryl complexesA Lannes, A Manceau, M Rovezzi, et al.Journal of Physics. Condensed Matter : an Institute of Physics Journal|May 15, 2014
Electronic structure and local distortions in epitaxial ScGaN filmsS M Knoll, M Rovezzi, S Zhang, et al.Physical Review Letters|October 15, 2008
Controlled aggregation of magnetic ions in a semiconductor: an experimental demonstrationA Bonanni, A Navarro-Quezada, Tian Li, et al.Pageof 1