Setup for optimized grazing incidence x-ray absorption experiments on thin films on substrates.

C Maurizio1, M Rovezzi, F Bardelli

  • 1CNR-INFM-OGG c/o ESRF, GILDA CRG 6, Rue Jules Horowitz, F-38043 Grenoble, France. maurizio@esrf.fr

Summary

We developed a new grazing incidence x-ray absorption spectroscopy (XAS) setup for analyzing thin films and interfaces. This method enhances surface signals while minimizing matrix interference, offering improved material analysis.

Related Concept Videos