Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

M Stöger

Showing results (1-10 of 42) with videos related to

Pageof 5
Sort By:
Ultramicroscopy|August 10, 2013
Low voltage EELS-how low?M Stöger-Pollach
Micron (Oxford, England : 1993)|April 9, 2008
Optical properties and bandgaps from low loss EELS: pitfalls and solutionsM Stöger-Pollach
Micron (Oxford, England : 1993)|May 18, 2010
Low voltage TEM: influences on electron energy loss spectrometry experimentsM Stöger-Pollach
Ultramicroscopy|February 18, 2014
A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEMM Stöger-Pollach
Die Rehabilitation|August 1, 1975
[What happens to paraplegics? (AUTHOR'S TRANSL)]E Nechwatal, M Stöger
Ultramicroscopy|April 3, 2007
The influence of relativistic energy losses on bandgap determination using valence EELSM Stöger-Pollach, P Schattschneider
Micron (Oxford, England : 1993)|April 20, 2006
Comment on "Investigation on optical properties of ZnO nanowires by electron energy-loss spectroscopy"M Stöger-Pollach, T Galek
Ultramicroscopy|August 11, 2007
Treating retardation effects in valence EELS spectra for Kramers-Kronig analysisM Stöger-Pollach, A Laister, P Schattschneider
Physical Review Letters|September 26, 2012
Novel vortex generator and mode converter for electron beamsP Schattschneider, M Stöger-Pollach, J Verbeeck
Ultramicroscopy|November 12, 2002
The separation of surface and bulk contributions in ELNES spectraP Schattschneider, M Stöger, C Hébert, et al.
Pageof 5

Showing results (1-10 of 42) with videos related to

Sort By:
Pageof 5
Ultramicroscopy|August 10, 2013
Low voltage EELS-how low?M Stöger-Pollach
Micron (Oxford, England : 1993)|April 9, 2008
Optical properties and bandgaps from low loss EELS: pitfalls and solutionsM Stöger-Pollach
Micron (Oxford, England : 1993)|May 18, 2010
Low voltage TEM: influences on electron energy loss spectrometry experimentsM Stöger-Pollach
Ultramicroscopy|February 18, 2014
A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEMM Stöger-Pollach
Die Rehabilitation|August 1, 1975
[What happens to paraplegics? (AUTHOR'S TRANSL)]E Nechwatal, M Stöger
Ultramicroscopy|April 3, 2007
The influence of relativistic energy losses on bandgap determination using valence EELSM Stöger-Pollach, P Schattschneider
Micron (Oxford, England : 1993)|April 20, 2006
Comment on "Investigation on optical properties of ZnO nanowires by electron energy-loss spectroscopy"M Stöger-Pollach, T Galek
Ultramicroscopy|August 11, 2007
Treating retardation effects in valence EELS spectra for Kramers-Kronig analysisM Stöger-Pollach, A Laister, P Schattschneider
Physical Review Letters|September 26, 2012
Novel vortex generator and mode converter for electron beamsP Schattschneider, M Stöger-Pollach, J Verbeeck
Ultramicroscopy|November 12, 2002
The separation of surface and bulk contributions in ELNES spectraP Schattschneider, M Stöger, C Hébert, et al.
Pageof 5