Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

M Troyon

Showing results (1-10 of 14) with videos related to

Pageof 2
Sort By:
Journal of Electron Microscopy Technique|March 1, 1989
Magnetic field emission gun with zirconiated emitterM Troyon
Journal of Colloid and Interface Science|June 13, 2001
General Equations Describing Elastic Indentation Depth and Normal Contact Stiffness versus LoadO. Piétrement, M. Troyon
Nanotechnology|August 11, 2011
Influence of electron irradiation on the electronic transport mechanisms during the conductive AFM imaging of InAs/GaAs quantum dots capped with a thin GaAs layerM Troyon, K Smaali
Nanotechnology|August 10, 2011
Application of nano-EBIC to the characterization of GaAs and InP homojunctionsK Smaali, M Troyon
Scanning|May 17, 2012
Is the exponent 3/2 justified in analysis of loading curve of pyramidal nanoindentations?M Troyon, F Abbès, J A Garcia Guzman
Journal of Microscopy|April 30, 2016
Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures' optical propertiesN B Bercu, M Troyon, M Molinari
Ultramicroscopy|December 7, 2007
High-resolution scanning near-field EBIC microscopy: application to the characterisation of a shallow ion implanted p+-n silicon junctionK Smaali, J Fauré, A El Hdiy, et al.
Nanotechnology|January 9, 2010
Conductive AFM microscopy study of the carrier transport and storage in Ge nanocrystals grown by dewettingK Gacem, A El Hdiy, M Troyon, et al.
Nano Letters|September 16, 2008
Growth of silicon nanowires of controlled diameters by electrodeposition in ionic liquid at room temperatureJ Mallet, M Molinari, F Martineau, et al.
Ultramicroscopy|August 6, 2005
Development of a shear force scanning near-field fluorescence microscope for biological applicationsG Y Shang, W H Qiao, F H Lei, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Journal of Electron Microscopy Technique|March 1, 1989
Magnetic field emission gun with zirconiated emitterM Troyon
Journal of Colloid and Interface Science|June 13, 2001
General Equations Describing Elastic Indentation Depth and Normal Contact Stiffness versus LoadO. Piétrement, M. Troyon
Nanotechnology|August 11, 2011
Influence of electron irradiation on the electronic transport mechanisms during the conductive AFM imaging of InAs/GaAs quantum dots capped with a thin GaAs layerM Troyon, K Smaali
Nanotechnology|August 10, 2011
Application of nano-EBIC to the characterization of GaAs and InP homojunctionsK Smaali, M Troyon
Scanning|May 17, 2012
Is the exponent 3/2 justified in analysis of loading curve of pyramidal nanoindentations?M Troyon, F Abbès, J A Garcia Guzman
Journal of Microscopy|April 30, 2016
Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures' optical propertiesN B Bercu, M Troyon, M Molinari
Ultramicroscopy|December 7, 2007
High-resolution scanning near-field EBIC microscopy: application to the characterisation of a shallow ion implanted p+-n silicon junctionK Smaali, J Fauré, A El Hdiy, et al.
Nanotechnology|January 9, 2010
Conductive AFM microscopy study of the carrier transport and storage in Ge nanocrystals grown by dewettingK Gacem, A El Hdiy, M Troyon, et al.
Nano Letters|September 16, 2008
Growth of silicon nanowires of controlled diameters by electrodeposition in ionic liquid at room temperatureJ Mallet, M Molinari, F Martineau, et al.
Ultramicroscopy|August 6, 2005
Development of a shear force scanning near-field fluorescence microscope for biological applicationsG Y Shang, W H Qiao, F H Lei, et al.
Pageof 2