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The Review of Scientific Instruments|February 2, 2015
Note: A stand on the basis of atomic force microscope to study substrates for imaging opticsN I Chkhalo, N N Salashchenko, M V ZorinaRossiiskii Fiziologicheskii Zhurnal Imeni I.M. Sechenova|May 26, 2007
[Properties of lung surfactant during changes in capsaicin-sensitive vagal afferents under conditions of emotional stress]I G Bryndina, V L Isaeva, M V ZorinaOptics Letters|February 14, 2015
Application of point diffraction interferometry for middle spatial frequency roughness detectionM V Svechnikov, N I Chkhalo, M N Toropov, et al.Optics Express|October 17, 2014
Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramicsN I Chkhalo, S A Churin, A E Pestov, et al.Applied Optics|April 26, 2022
Influence of ion-beam etching by Ar ions with an energy of 200-1000 eV on the roughness and sputtering yield of a single-crystal silicon surfaceM S Mikhailenko, A E Pestov, N I Chkhalo, et al.Applied Optics|February 25, 2016
Ion-beam polishing of fused silica substrates for imaging soft x-ray and extreme ultraviolet opticsN I Chkhalo, S A Churin, M S Mikhaylenko, et al.Applied Optics|August 22, 2018
Polishing the surface of a z-cut KDP crystal by neutralized argon ionsN I Chkhalo, A V Kirsanov, G A Luchinin, et al.Journal of Synchrotron Radiation|August 29, 2003
Short-period multilayer X-ray mirrorsS S Andreev, M S Bibishkin, N I Chkhalo, et al.Journal of X-Ray Science and Technology|July 9, 2019
X-ray scattering by the fused silica surface etched by low-energy Ar ionsM M Barysheva, N I Chkhalo, M N Drozdov, et al.Applied Optics|May 3, 2019
Ultrasmooth beryllium substrates for solar astronomy in extreme ultraviolet wavelengthsN I Chkhalo, M S Mikhailenko, A E Pestov, et al.Pageof 2