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Ultramicroscopy|December 28, 2010
Mapping titanium and tin oxide phases using EELS: an application of independent component analysisF de la Peña, M-H Berger, J-F Hochepied, et al.Scientific Reports|June 16, 2016
Atomic-resolved depth profile of strain and cation intermixing around LaAlO3/SrTiO3 interfacesH Zaid, M H Berger, D Jalabert, et al.Nature Materials|April 15, 2020
Broad spectral tuning of ultra-low-loss polaritons in a van der Waals crystal by intercalationJavier Taboada-Gutiérrez, Gonzalo Álvarez-Pérez, Jiahua Duan, et al.Pageof 1