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Manuela Klaus

Showing results (1-10 of 15) with videos related to

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Journal of Applied Crystallography|August 7, 2024
A study of stress, composition and grain interaction gradients in energy-dispersive X-ray stress analysis on materials with cubic symmetryChristoph Genzel, Manuela Klaus
Journal of Applied Crystallography|April 9, 2021
Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structureAndreas Hollmann, Matthias Meixner, Manuela Klaus, et al.
Journal of Applied Crystallography|October 9, 2025
Extending the depth range in energy-dispersive X-ray stress analysis by simultaneous multi-detector data acquisition in equatorial scattering geometryChristoph Genzel, Daniel Apel, Mirko Boin, et al.
Journal of Applied Crystallography|April 9, 2021
Nondestructive residual stress depth profile analysis at the inner surface of small boreholes using energy-dispersive diffraction under laboratory conditionsChristoph Genzel, Matthias Meixner, Daniel Apel, et al.
Journal of Applied Crystallography|April 10, 2023
Energy-dispersive X-ray stress analysis under geometric constraints: exploiting the material's inherent anisotropyChristoph Genzel, Manuela Klaus, Nico Hempel, et al.
Journal of Applied Crystallography|August 14, 2020
<i>EDDIDAT</i>: a graphical user interface for the analysis of energy-dispersive diffraction dataDaniel Apel, Martin Genzel, Matthias Meixner, et al.
Materials (Basel, Switzerland)|August 5, 2017
An Assessment of Subsurface Residual Stress Analysis in SLM Ti-6Al-4VTatiana Mishurova, Sandra Cabeza, Katia Artzt, et al.
ACS Applied Materials & Interfaces|October 18, 2017
Influence of the Grain Size on the Properties of CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> Thin FilmsOleksandra Shargaieva, Felix Lang, Jörg Rappich, et al.
Journal of Synchrotron Radiation|September 7, 2019
Energy-dispersive Laue diffraction by means of a pnCCD detector coupled to a CsI(Tl) scintillator using ultra-hard X-ray synchrotron radiationMohammad Shokr, Amir Tosson, Ali Abboud, et al.
Journal of Applied Crystallography|June 14, 2018
A multireflection and multiwavelength residual stress determination method using energy dispersive diffractionMarianna Marciszko, Andrzej Baczmański, Manuela Klaus, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Journal of Applied Crystallography|August 7, 2024
A study of stress, composition and grain interaction gradients in energy-dispersive X-ray stress analysis on materials with cubic symmetryChristoph Genzel, Manuela Klaus
Journal of Applied Crystallography|April 9, 2021
Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structureAndreas Hollmann, Matthias Meixner, Manuela Klaus, et al.
Journal of Applied Crystallography|October 9, 2025
Extending the depth range in energy-dispersive X-ray stress analysis by simultaneous multi-detector data acquisition in equatorial scattering geometryChristoph Genzel, Daniel Apel, Mirko Boin, et al.
Journal of Applied Crystallography|April 9, 2021
Nondestructive residual stress depth profile analysis at the inner surface of small boreholes using energy-dispersive diffraction under laboratory conditionsChristoph Genzel, Matthias Meixner, Daniel Apel, et al.
Journal of Applied Crystallography|April 10, 2023
Energy-dispersive X-ray stress analysis under geometric constraints: exploiting the material's inherent anisotropyChristoph Genzel, Manuela Klaus, Nico Hempel, et al.
Journal of Applied Crystallography|August 14, 2020
<i>EDDIDAT</i>: a graphical user interface for the analysis of energy-dispersive diffraction dataDaniel Apel, Martin Genzel, Matthias Meixner, et al.
Materials (Basel, Switzerland)|August 5, 2017
An Assessment of Subsurface Residual Stress Analysis in SLM Ti-6Al-4VTatiana Mishurova, Sandra Cabeza, Katia Artzt, et al.
ACS Applied Materials & Interfaces|October 18, 2017
Influence of the Grain Size on the Properties of CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> Thin FilmsOleksandra Shargaieva, Felix Lang, Jörg Rappich, et al.
Journal of Synchrotron Radiation|September 7, 2019
Energy-dispersive Laue diffraction by means of a pnCCD detector coupled to a CsI(Tl) scintillator using ultra-hard X-ray synchrotron radiationMohammad Shokr, Amir Tosson, Ali Abboud, et al.
Journal of Applied Crystallography|June 14, 2018
A multireflection and multiwavelength residual stress determination method using energy dispersive diffractionMarianna Marciszko, Andrzej Baczmański, Manuela Klaus, et al.
Pageof 2