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Journal of Applied Crystallography
|
August 7, 2024
A study of stress, composition and grain interaction gradients in energy-dispersive X-ray stress analysis on materials with cubic symmetry
Christoph Genzel, Manuela Klaus
Journal of Applied Crystallography
|
April 9, 2021
Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structure
Andreas Hollmann, Matthias Meixner, Manuela Klaus, et al.
Journal of Applied Crystallography
|
October 9, 2025
Extending the depth range in energy-dispersive X-ray stress analysis by simultaneous multi-detector data acquisition in equatorial scattering geometry
Christoph Genzel, Daniel Apel, Mirko Boin, et al.
Journal of Applied Crystallography
|
April 9, 2021
Nondestructive residual stress depth profile analysis at the inner surface of small boreholes using energy-dispersive diffraction under laboratory conditions
Christoph Genzel, Matthias Meixner, Daniel Apel, et al.
Journal of Applied Crystallography
|
April 10, 2023
Energy-dispersive X-ray stress analysis under geometric constraints: exploiting the material's inherent anisotropy
Christoph Genzel, Manuela Klaus, Nico Hempel, et al.
Journal of Applied Crystallography
|
August 14, 2020
<i>EDDIDAT</i>: a graphical user interface for the analysis of energy-dispersive diffraction data
Daniel Apel, Martin Genzel, Matthias Meixner, et al.
Materials (Basel, Switzerland)
|
August 5, 2017
An Assessment of Subsurface Residual Stress Analysis in SLM Ti-6Al-4V
Tatiana Mishurova, Sandra Cabeza, Katia Artzt, et al.
ACS Applied Materials & Interfaces
|
October 18, 2017
Influence of the Grain Size on the Properties of CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> Thin Films
Oleksandra Shargaieva, Felix Lang, Jörg Rappich, et al.
Journal of Synchrotron Radiation
|
September 7, 2019
Energy-dispersive Laue diffraction by means of a pnCCD detector coupled to a CsI(Tl) scintillator using ultra-hard X-ray synchrotron radiation
Mohammad Shokr, Amir Tosson, Ali Abboud, et al.
Journal of Applied Crystallography
|
June 14, 2018
A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
Marianna Marciszko, Andrzej Baczmański, Manuela Klaus, et al.
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Search research articles
Search
Showing results (1-10 of 15) with videos related to
Sort By:
Page
of 2
Journal of Applied Crystallography
|
August 7, 2024
A study of stress, composition and grain interaction gradients in energy-dispersive X-ray stress analysis on materials with cubic symmetry
Christoph Genzel, Manuela Klaus
Journal of Applied Crystallography
|
April 9, 2021
Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structure
Andreas Hollmann, Matthias Meixner, Manuela Klaus, et al.
Journal of Applied Crystallography
|
October 9, 2025
Extending the depth range in energy-dispersive X-ray stress analysis by simultaneous multi-detector data acquisition in equatorial scattering geometry
Christoph Genzel, Daniel Apel, Mirko Boin, et al.
Journal of Applied Crystallography
|
April 9, 2021
Nondestructive residual stress depth profile analysis at the inner surface of small boreholes using energy-dispersive diffraction under laboratory conditions
Christoph Genzel, Matthias Meixner, Daniel Apel, et al.
Journal of Applied Crystallography
|
April 10, 2023
Energy-dispersive X-ray stress analysis under geometric constraints: exploiting the material's inherent anisotropy
Christoph Genzel, Manuela Klaus, Nico Hempel, et al.
Journal of Applied Crystallography
|
August 14, 2020
<i>EDDIDAT</i>: a graphical user interface for the analysis of energy-dispersive diffraction data
Daniel Apel, Martin Genzel, Matthias Meixner, et al.
Materials (Basel, Switzerland)
|
August 5, 2017
An Assessment of Subsurface Residual Stress Analysis in SLM Ti-6Al-4V
Tatiana Mishurova, Sandra Cabeza, Katia Artzt, et al.
ACS Applied Materials & Interfaces
|
October 18, 2017
Influence of the Grain Size on the Properties of CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> Thin Films
Oleksandra Shargaieva, Felix Lang, Jörg Rappich, et al.
Journal of Synchrotron Radiation
|
September 7, 2019
Energy-dispersive Laue diffraction by means of a pnCCD detector coupled to a CsI(Tl) scintillator using ultra-hard X-ray synchrotron radiation
Mohammad Shokr, Amir Tosson, Ali Abboud, et al.
Journal of Applied Crystallography
|
June 14, 2018
A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
Marianna Marciszko, Andrzej Baczmański, Manuela Klaus, et al.
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