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Maoxin Song

Showing results (1-10 of 7) with videos related to

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Optics Express|May 15, 2020
Radiometer-to-imager in-flight cross calibration and verificationShuangShuang Zhu, Jin Hong, Zhenyang Li, et al.
Optics Express|March 18, 2026
Chromatic aberration and dispersion in image-based overlay metrology: influence analysis and correction strategyWuhao Liu, Mingchun Ling, Maoxin Song, et al.
Micromachines|May 27, 2026
High-Precision Localization Algorithm for Target Symmetry Center in Image-Based Overlay MetrologyWuhao Liu, Maoxin Song, Shuming Shi, et al.
Optics Express|September 10, 2020
Integration model of POSP measurement spatial response functionXuefeng Lei, Shuangshuang Zhu, Zhenyang Li, et al.
Micromachines|June 26, 2026
High-Precision LCCD-Based Focus Metrology for I-Line Lithography: Multi-Sample Repeatability and Adaptability EvaluationHengrui Guan, Xinxin Zhao, Yuheng Chu, et al.
Micromachines|January 8, 2025
Structural Design and Simulation of Multi-Detector Same-Platform Laser Gyro Reflector Substrate Defect Detection PrototypeJun Wang, Zhenyang Li, Maoxin Song, et al.
Optics Express|August 13, 2025
End-to-end physics-informed multi-branch GAN for enhanced DoFP polarization image reconstructionHaoran Liu, Zhongding Gu, Shuming Shi, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Optics Express|May 15, 2020
Radiometer-to-imager in-flight cross calibration and verificationShuangShuang Zhu, Jin Hong, Zhenyang Li, et al.
Optics Express|March 18, 2026
Chromatic aberration and dispersion in image-based overlay metrology: influence analysis and correction strategyWuhao Liu, Mingchun Ling, Maoxin Song, et al.
Micromachines|May 27, 2026
High-Precision Localization Algorithm for Target Symmetry Center in Image-Based Overlay MetrologyWuhao Liu, Maoxin Song, Shuming Shi, et al.
Optics Express|September 10, 2020
Integration model of POSP measurement spatial response functionXuefeng Lei, Shuangshuang Zhu, Zhenyang Li, et al.
Micromachines|June 26, 2026
High-Precision LCCD-Based Focus Metrology for I-Line Lithography: Multi-Sample Repeatability and Adaptability EvaluationHengrui Guan, Xinxin Zhao, Yuheng Chu, et al.
Micromachines|January 8, 2025
Structural Design and Simulation of Multi-Detector Same-Platform Laser Gyro Reflector Substrate Defect Detection PrototypeJun Wang, Zhenyang Li, Maoxin Song, et al.
Optics Express|August 13, 2025
End-to-end physics-informed multi-branch GAN for enhanced DoFP polarization image reconstructionHaoran Liu, Zhongding Gu, Shuming Shi, et al.
Pageof 1