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Marco Schowalter

Showing results (31-40 of 54) with videos related to

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Nano Letters|February 6, 2018
Ultrathin Au-Alloy Nanowires at the Liquid-Liquid InterfaceDipanwita Chatterjee, Shwetha Shetty, Knut Müller-Caspary, et al.
ACS Applied Energy Materials|June 1, 2021
Double Flame-Fabricated High-Performance AlPO<sub>4</sub>/LiMn<sub>2</sub>O<sub>4</sub> Cathode Material for Li-Ion BatteriesHaipeng Li, Collins Erinmwingbovo, Johannes Birkenstock, et al.
Ultramicroscopy|July 5, 2015
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 11, 2014
Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM imagesMarco Schowalter, Ingo Stoffers, Florian F Krause, et al.
Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
Ultramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Nature Communications|December 16, 2014
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffractionKnut Müller, Florian F Krause, Armand Béché, et al.
Chemistryopen|July 12, 2021
Synthesis and Characterization of Ligand-Linked Pt Nanoparticles: Tunable, Three-Dimensional, Porous Networks for Catalytic Hydrogen SensingDaniel Loof, Oliver Thüringer, Marco Schowalter, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Pageof 6

Showing results (31-40 of 54) with videos related to

Sort By:
Pageof 6
Nano Letters|February 6, 2018
Ultrathin Au-Alloy Nanowires at the Liquid-Liquid InterfaceDipanwita Chatterjee, Shwetha Shetty, Knut Müller-Caspary, et al.
ACS Applied Energy Materials|June 1, 2021
Double Flame-Fabricated High-Performance AlPO<sub>4</sub>/LiMn<sub>2</sub>O<sub>4</sub> Cathode Material for Li-Ion BatteriesHaipeng Li, Collins Erinmwingbovo, Johannes Birkenstock, et al.
Ultramicroscopy|July 5, 2015
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 11, 2014
Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM imagesMarco Schowalter, Ingo Stoffers, Florian F Krause, et al.
Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
Ultramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Nature Communications|December 16, 2014
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffractionKnut Müller, Florian F Krause, Armand Béché, et al.
Chemistryopen|July 12, 2021
Synthesis and Characterization of Ligand-Linked Pt Nanoparticles: Tunable, Three-Dimensional, Porous Networks for Catalytic Hydrogen SensingDaniel Loof, Oliver Thüringer, Marco Schowalter, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Pageof 6