Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Mark A Anders

Showing results (1-10 of 6) with videos related to

Pageof 1
Sort By:
Scientific Reports|April 9, 2022
Data-driven RRAM device models using Kriging interpolationImtiaz Hossen, Mark A Anders, Lin Wang, et al.
Scientific Reports|November 29, 2016
Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbideCorey J Cochrane, Jordana Blacksberg, Mark A Anders, et al.
Scientific Reports|January 17, 2017
Erratum: Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbideCorey J Cochrane, Jordana Blacksberg, Mark A Anders, et al.
Analytical Chemistry|August 6, 2019
Nonresonant Transmission Line Probe for Sensitive Interferometric Electron Spin Resonance DetectionPragya R Shrestha, Nandita Abhyankar, Mark A Anders, et al.
IEEE Transactions on Device and Materials Reliability : a Publication of the IEEE Electron Devices Society and the IEEE Reliability Society|April 16, 2019
Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing StationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
The Review of Scientific Instruments|February 3, 2019
Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing stationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Scientific Reports|April 9, 2022
Data-driven RRAM device models using Kriging interpolationImtiaz Hossen, Mark A Anders, Lin Wang, et al.
Scientific Reports|November 29, 2016
Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbideCorey J Cochrane, Jordana Blacksberg, Mark A Anders, et al.
Scientific Reports|January 17, 2017
Erratum: Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbideCorey J Cochrane, Jordana Blacksberg, Mark A Anders, et al.
Analytical Chemistry|August 6, 2019
Nonresonant Transmission Line Probe for Sensitive Interferometric Electron Spin Resonance DetectionPragya R Shrestha, Nandita Abhyankar, Mark A Anders, et al.
IEEE Transactions on Device and Materials Reliability : a Publication of the IEEE Electron Devices Society and the IEEE Reliability Society|April 16, 2019
Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing StationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
The Review of Scientific Instruments|February 3, 2019
Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing stationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
Pageof 1