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Mark J McLean

Showing results (1-10 of 4) with videos related to

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Ultramicroscopy|November 22, 2017
In-situ elastic strain mapping during micromechanical testing using EBSDMark J McLean, William A Osborn
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 19, 2019
Selected Area Electron Beam Induced Deposition of Pt and W for EBSD BackgroundsWilliam A Osborn, Mark J McLean, Brian Bush
Journal of Research of the National Institute of Standards and Technology|March 10, 2016
Smart Electronic Laboratory Notebooks for the NIST Research EnvironmentRichard S Gates, Mark J McLean, William A Osborn
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 6, 2016
Aberration-Corrected Scanning Transmission Electron Microscope (STEM) Through-Focus Imaging for Three-Dimensional Atomic Analysis of Bismuth Segregation on Copper [001]/33° Twist Bicrystal Grain BoundariesCharles Austin Wade, Mark J McLean, Richard P Vinci, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|November 22, 2017
In-situ elastic strain mapping during micromechanical testing using EBSDMark J McLean, William A Osborn
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 19, 2019
Selected Area Electron Beam Induced Deposition of Pt and W for EBSD BackgroundsWilliam A Osborn, Mark J McLean, Brian Bush
Journal of Research of the National Institute of Standards and Technology|March 10, 2016
Smart Electronic Laboratory Notebooks for the NIST Research EnvironmentRichard S Gates, Mark J McLean, William A Osborn
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 6, 2016
Aberration-Corrected Scanning Transmission Electron Microscope (STEM) Through-Focus Imaging for Three-Dimensional Atomic Analysis of Bismuth Segregation on Copper [001]/33° Twist Bicrystal Grain BoundariesCharles Austin Wade, Mark J McLean, Richard P Vinci, et al.
Pageof 1