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Markus Benk

Showing results (1-10 of 3) with videos related to

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The Review of Scientific Instruments|April 2, 2009
Adaptive spatially resolving detector for the extreme ultraviolet with absolute measuring capabilityMarkus Benk, Klaus Bergmann
Optics Letters|October 17, 2008
Compact soft x-ray microscope using a gas-discharge light sourceMarkus Benk, Klaus Bergmann, David Schäfer, et al.
Applied Optics|April 22, 2017
Amplitude versus phase effects in extreme ultraviolet lithography mask scattering and imagingPatrick P Naulleau, Markus Benk, Kenneth A Goldberg, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|April 2, 2009
Adaptive spatially resolving detector for the extreme ultraviolet with absolute measuring capabilityMarkus Benk, Klaus Bergmann
Optics Letters|October 17, 2008
Compact soft x-ray microscope using a gas-discharge light sourceMarkus Benk, Klaus Bergmann, David Schäfer, et al.
Applied Optics|April 22, 2017
Amplitude versus phase effects in extreme ultraviolet lithography mask scattering and imagingPatrick P Naulleau, Markus Benk, Kenneth A Goldberg, et al.
Pageof 1