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Markus Lentzen

Showing results (1-10 of 9) with videos related to

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Acta Crystallographica. Section A, Foundations and Advances|November 7, 2019
Relativistic correction of atomic scattering factors for high-energy electron diffractionMarkus Lentzen
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 14, 2022
Spin-Dependent Nonlinear Contrast Transfer in Transmission Electron MicroscopyMarkus Lentzen
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correctionMarkus Lentzen
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Contrast transfer and resolution limits for sub-angstrom high-resolution transmission electron microscopyMarkus Lentzen
Ultramicroscopy|December 8, 2016
On the influence of the electron dose rate on the HRTEM image contrastJuri Barthel, Markus Lentzen, Andreas Thust
Ultramicroscopy|May 9, 2017
Response to the comment by C. Kisielowski, H.A. Calderon, F.R. Chen, S. Helveg, J.R. Jinschek, P. Specht, D. Van Dyck on the article "On the influence of the electron dose-rate on the HRTEM image contrast" by J. Barthel, M. Lentzen, A. Thust, Ultramicroscopy 176 (2017) 37-45Juri Barthel, Markus Lentzen, Andreas Thust
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
High-resolution transmission electron microscopy using negative spherical aberrationChun-Lin Jia, Markus Lentzen, Knut Urban
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Negative spherical aberration ultrahigh-resolution imaging in corrected transmission electron microscopyKnut W Urban, Chun-Lin Jia, Lothar Houben, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 5, 2013
Atomic-scale measurement of structure and chemistry of a single-unit-cell layer of LaAlO3 embedded in SrTiO3Chun-Lin Jia, Juri Barthel, Felix Gunkel, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Acta Crystallographica. Section A, Foundations and Advances|November 7, 2019
Relativistic correction of atomic scattering factors for high-energy electron diffractionMarkus Lentzen
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 14, 2022
Spin-Dependent Nonlinear Contrast Transfer in Transmission Electron MicroscopyMarkus Lentzen
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correctionMarkus Lentzen
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Contrast transfer and resolution limits for sub-angstrom high-resolution transmission electron microscopyMarkus Lentzen
Ultramicroscopy|December 8, 2016
On the influence of the electron dose rate on the HRTEM image contrastJuri Barthel, Markus Lentzen, Andreas Thust
Ultramicroscopy|May 9, 2017
Response to the comment by C. Kisielowski, H.A. Calderon, F.R. Chen, S. Helveg, J.R. Jinschek, P. Specht, D. Van Dyck on the article "On the influence of the electron dose-rate on the HRTEM image contrast" by J. Barthel, M. Lentzen, A. Thust, Ultramicroscopy 176 (2017) 37-45Juri Barthel, Markus Lentzen, Andreas Thust
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
High-resolution transmission electron microscopy using negative spherical aberrationChun-Lin Jia, Markus Lentzen, Knut Urban
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Negative spherical aberration ultrahigh-resolution imaging in corrected transmission electron microscopyKnut W Urban, Chun-Lin Jia, Lothar Houben, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 5, 2013
Atomic-scale measurement of structure and chemistry of a single-unit-cell layer of LaAlO3 embedded in SrTiO3Chun-Lin Jia, Juri Barthel, Felix Gunkel, et al.
Pageof 1