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Martin Linck

Showing results (1-10 of 16) with videos related to

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Ultramicroscopy|November 13, 2012
Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEMMartin Linck
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Off-axis electron holography in an aberration-corrected transmission electron microscopeHannes Lichte, Dorin Geiger, Martin Linck
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2010
Aberration correction and electron holographyHannes Lichte, Martin Linck, Dorin Geiger, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Electron holography with a Cs-corrected transmission electron microscopeDorin Geiger, Hannes Lichte, Martin Linck, et al.
Ultramicroscopy|March 1, 2011
Imaging modes for potential mapping in semiconductor devices by electron holography with improved lateral resolutionJan Sickmann, Petr Formánek, Martin Linck, et al.
Advanced Structural and Chemical Imaging|December 23, 2016
Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samplesColin Ophus, Haider I Rasool, Martin Linck, et al.
Ultramicroscopy|June 27, 2017
Aberration corrected STEM by means of diffraction gratingsMartin Linck, Peter A Ercius, Jordan S Pierce, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 20, 2024
An Efficient Electron Ptychography Method for Retrieving the Object Spectrum from Only a Few IterationsZhongbo Li, Johannes Biskupek, Martin Linck, et al.
Ultramicroscopy|January 28, 2015
A flexible multi-stimuli in situ (S)TEM: concept, optical performance, and outlookFelix Börrnert, Heiko Müller, Thomas Riedel, et al.
Ultramicroscopy|July 3, 2017
Corrigendum to: "A flexible multi-stimuli in-situ (S)TEM: Concept and optical performance" [Ultramicroscopy 151 (2015) 31-36]Felix Börrnert, Heiko Müller, Thomas Riedel, et al.
Pageof 2

Showing results (1-10 of 16) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|November 13, 2012
Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEMMartin Linck
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Off-axis electron holography in an aberration-corrected transmission electron microscopeHannes Lichte, Dorin Geiger, Martin Linck
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2010
Aberration correction and electron holographyHannes Lichte, Martin Linck, Dorin Geiger, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Electron holography with a Cs-corrected transmission electron microscopeDorin Geiger, Hannes Lichte, Martin Linck, et al.
Ultramicroscopy|March 1, 2011
Imaging modes for potential mapping in semiconductor devices by electron holography with improved lateral resolutionJan Sickmann, Petr Formánek, Martin Linck, et al.
Advanced Structural and Chemical Imaging|December 23, 2016
Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samplesColin Ophus, Haider I Rasool, Martin Linck, et al.
Ultramicroscopy|June 27, 2017
Aberration corrected STEM by means of diffraction gratingsMartin Linck, Peter A Ercius, Jordan S Pierce, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 20, 2024
An Efficient Electron Ptychography Method for Retrieving the Object Spectrum from Only a Few IterationsZhongbo Li, Johannes Biskupek, Martin Linck, et al.
Ultramicroscopy|January 28, 2015
A flexible multi-stimuli in situ (S)TEM: concept, optical performance, and outlookFelix Börrnert, Heiko Müller, Thomas Riedel, et al.
Ultramicroscopy|July 3, 2017
Corrigendum to: "A flexible multi-stimuli in-situ (S)TEM: Concept and optical performance" [Ultramicroscopy 151 (2015) 31-36]Felix Börrnert, Heiko Müller, Thomas Riedel, et al.
Pageof 2