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Martin Linck

Showing results (11-20 of 16) with videos related to

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Journal of the American Chemical Society|April 5, 2013
Atomic resolution imaging of grain boundary defects in monolayer chemical vapor deposition-grown hexagonal boron nitrideAshley L Gibb, Nasim Alem, Jian-Hao Chen, et al.
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|January 11, 2017
Origins and demonstrations of electrons with orbital angular momentumBenjamin J McMorran, Amit Agrawal, Peter A Ercius, et al.
Micron (Oxford, England : 1993)|August 18, 2023
Effect of self and extrinsic encapsulation on electron resilience of porous 2D polymer nanosheetsDavid Mücke, Martin Linck, Giulio Guzzinati, et al.
Ultramicroscopy|December 17, 2021
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kVRyusuke Sagawa, Akira Yasuhara, Hiroki Hashiguchi, et al.
Nature Methods|October 25, 2024
Elemental mapping in single-particle reconstructions by reconstructed electron energy-loss analysisOlivia Pfeil-Gardiner, Higor Vinícius Dias Rosa, Dietmar Riedel, et al.
Physical Review Letters|August 27, 2016
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kVMartin Linck, Peter Hartel, Stephan Uhlemann, et al.
Pageof 2

Showing results (11-20 of 16) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 16 results.
Journal of the American Chemical Society|April 5, 2013
Atomic resolution imaging of grain boundary defects in monolayer chemical vapor deposition-grown hexagonal boron nitrideAshley L Gibb, Nasim Alem, Jian-Hao Chen, et al.
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|January 11, 2017
Origins and demonstrations of electrons with orbital angular momentumBenjamin J McMorran, Amit Agrawal, Peter A Ercius, et al.
Micron (Oxford, England : 1993)|August 18, 2023
Effect of self and extrinsic encapsulation on electron resilience of porous 2D polymer nanosheetsDavid Mücke, Martin Linck, Giulio Guzzinati, et al.
Ultramicroscopy|December 17, 2021
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kVRyusuke Sagawa, Akira Yasuhara, Hiroki Hashiguchi, et al.
Nature Methods|October 25, 2024
Elemental mapping in single-particle reconstructions by reconstructed electron energy-loss analysisOlivia Pfeil-Gardiner, Higor Vinícius Dias Rosa, Dietmar Riedel, et al.
Physical Review Letters|August 27, 2016
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kVMartin Linck, Peter Hartel, Stephan Uhlemann, et al.
Pageof 2