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Rapid Communications in Mass Spectrometry : RCM|November 29, 2008
Cluster ion beam profiling of organics by secondary ion mass spectrometry--does sodium affect the molecular ion intensity at interfaces?Felicia M Green, Ian S Gilmore, Martin P SeahRapid Communications in Mass Spectrometry : RCM|January 23, 2009
G-SIMS: relative effectiveness of different monatomic primary ion source combinationsMartin P Seah, Ian S Gilmore, Felicia M GreenJournal of the American Society for Mass Spectrometry|December 8, 2009
Relationships between cluster secondary ion mass intensities generated by different cluster primary ionsMartin P Seah, Felicia M Green, Ian S GilmoreRapid Communications in Mass Spectrometry : RCM|July 26, 2008
Imaging G-SIMS: a novel bismuth-manganese source emitterFelicia M Green, Felix Kollmer, Ewald Niehuis, et al.The Journal of Physical Chemistry. B|February 8, 2008
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMSAlexander G Shard, Felicia M Green, Paul J Brewer, et al.Analytical Chemistry|September 11, 2014
VAMAS interlaboratory study for desorption electrospray ionization mass spectrometry (DESI MS) intensity repeatability and constancyElzbieta Gurdak, Felicia M Green, Paulina D Rakowska, et al.Journal of the American Society for Mass Spectrometry|April 24, 2016
Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass SpectrometryMartin P Seah, Rasmus Havelund, Ian S GilmoreJournal of the American Society for Mass Spectrometry|June 11, 2014
Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organicsRasmus Havelund, Martin P Seah, Alexander G Shard, et al.The Analyst|July 14, 2011
Analysis of personal care products on model skin surfaces using DESI and PADI ambient mass spectrometryTara L Salter, Felicia M Green, Nilofar Faruqui, et al.Journal of the American Society for Mass Spectrometry|September 29, 2011
Topography and field effects in secondary ion mass spectrometry--part I: conducting samplesJoanna L S Lee, Ian S Gilmore, Martin P Seah, et al.Pageof 7