Imaging G-SIMS: a novel bismuth-manganese source emitter

Area of Science:

• Surface Science
• Analytical Chemistry
• Materials Science

Background:

• Static secondary ion mass spectrometry (SSIMS) is complex for organic surface analysis.
• G-SIMS simplifies SSIMS by using dual ion beams to achieve low fragmentation.
• Current G-SIMS methods require precise spatial alignment of ion beams, hindering wider adoption.

Purpose of the Study:

• To develop a novel emitter for liquid metal ion sources (LMIS) to simplify G-SIMS implementation.
• To improve the ease of spatial registration for dual ion beams in G-SIMS.
• To enhance G-SIMS imaging and spectroscopy capabilities for organic surface analysis.

Main Methods:

• Development of a novel bismuth-manganese emitter (G-tip) for LMIS.
• Utilizing the G-tip to generate dual ion beams with distinct fragmentation conditions.
• Performing G-SIMS imaging and spectroscopy on organic surfaces.

Main Results:

• The novel G-tip simplifies the spatial alignment of dual ion beams.
• Excellent G-SIMS imaging and spectroscopy were achieved.
• Bismuth cluster ion beam performance was maintained without significant compromise.

Conclusions:

• The G-tip emitter facilitates easier and more effective G-SIMS analysis.
• This innovation lowers the barrier for wider G-SIMS adoption in organic surface characterization.
• G-SIMS provides less complex spectra with enhanced structural information, resembling electron ionization mass spectra.