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Rapid Communications in Mass Spectrometry : RCM|November 6, 2012
Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogramSatoka Aoyagi, Ian S Gilmore, Ichiro Mihara, et al.
Rapid Communications in Mass Spectrometry : RCM|July 26, 2008
Imaging G-SIMS: a novel bismuth-manganese source emitterFelicia M Green, Felix Kollmer, Ewald Niehuis, et al.
The Journal of Physical Chemistry. B|February 8, 2008
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMSAlexander G Shard, Felicia M Green, Paul J Brewer, et al.
Analytical Chemistry|September 11, 2014
VAMAS interlaboratory study for desorption electrospray ionization mass spectrometry (DESI MS) intensity repeatability and constancyElzbieta Gurdak, Felicia M Green, Paulina D Rakowska, et al.
ACS Applied Materials & Interfaces|January 4, 2019
Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass SpectrometryMariavitalia Tiddia, Ichiro Mihara, Martin P Seah, et al.
Analytical Chemistry|February 27, 2016
Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion SourcesYuta Yokoyama, Satoka Aoyagi, Makiko Fujii, et al.
Analytical Chemistry|August 18, 2012
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory studyAlexander G Shard, Rasmus Havelund, Martin P Seah, et al.
Analytical Chemistry|October 12, 2016
Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue SampleJean-Luc Vorng, Anna M Kotowska, Melissa K Passarelli, et al.
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