Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Martin Trentzsch

Showing results (1-10 of 3) with videos related to

Pageof 1
Sort By:
ACS Applied Materials & Interfaces|September 17, 2020
Frequency Mixing with HfO<sub>2</sub>-Based Ferroelectric TransistorsHalid Mulaosmanovic, Stefan Dünkel, Martin Trentzsch, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|August 26, 2011
Interaction of oxygen vacancies and lanthanum in Hf-based high-k dielectrics: an ab initio investigationEbrahim Nadimi, Rolf Ottking, Philipp Plänitz, et al.
Nanomaterials (Basel, Switzerland)|February 27, 2020
Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi DiffractionMaximilian Lederer, Thomas Kämpfe, Norman Vogel, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
ACS Applied Materials & Interfaces|September 17, 2020
Frequency Mixing with HfO<sub>2</sub>-Based Ferroelectric TransistorsHalid Mulaosmanovic, Stefan Dünkel, Martin Trentzsch, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|August 26, 2011
Interaction of oxygen vacancies and lanthanum in Hf-based high-k dielectrics: an ab initio investigationEbrahim Nadimi, Rolf Ottking, Philipp Plänitz, et al.
Nanomaterials (Basel, Switzerland)|February 27, 2020
Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi DiffractionMaximilian Lederer, Thomas Kämpfe, Norman Vogel, et al.
Pageof 1