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Martin Y Sohn

Showing results (1-10 of 5) with videos related to

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APL Photonics|May 15, 2026
Radial polarization imaging of entangled biphoton stateJiung Kim, Jeeseong Hwang, Martin Y Sohn
Optik|March 6, 2018
Design of angle-resolved illumination optics using nonimaging bi-telecentricity for 193 nm scatterfield microscopyMartin Y Sohn, Bryan M Barnes, Richard M Silver
Optics Express|November 6, 2019
Effect of partial coherence on dimensional measurement sensitivity for DUV scatterfield imaging microscopyYoon Sung Bae, Martin Y Sohn, Dong-Ryoung Lee, et al.
Optics Express|February 20, 2026
Dynamics of microparticle launching and loading into optical trapsKwan Seob Park, Kiana Malmir, Glenn E Holland, et al.
Optics Express|November 13, 2013
Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopyBryan M Barnes, Martin Y Sohn, Francois Goasmat, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
APL Photonics|May 15, 2026
Radial polarization imaging of entangled biphoton stateJiung Kim, Jeeseong Hwang, Martin Y Sohn
Optik|March 6, 2018
Design of angle-resolved illumination optics using nonimaging bi-telecentricity for 193 nm scatterfield microscopyMartin Y Sohn, Bryan M Barnes, Richard M Silver
Optics Express|November 6, 2019
Effect of partial coherence on dimensional measurement sensitivity for DUV scatterfield imaging microscopyYoon Sung Bae, Martin Y Sohn, Dong-Ryoung Lee, et al.
Optics Express|February 20, 2026
Dynamics of microparticle launching and loading into optical trapsKwan Seob Park, Kiana Malmir, Glenn E Holland, et al.
Optics Express|November 13, 2013
Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopyBryan M Barnes, Martin Y Sohn, Francois Goasmat, et al.
Pageof 1