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Ultramicroscopy|August 10, 2015
Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopyDmitry Tyutyunnikov, Masatoshi Mitsuhara, Christoph T Koch
Materials (Basel, Switzerland)|January 21, 2023
Tensile Deformation Behaviors of Pure Ti with Different Grain Sizes under Wide-Range of Strain RateMisaki Deguchi, Shigeto Yamasaki, Masatoshi Mitsuhara, et al.
ACS Nano|June 5, 2018
Controlled Growth of Large-Area Uniform Multilayer Hexagonal Boron Nitride as an Effective 2D SubstrateYuki Uchida, Sho Nakandakari, Kenji Kawahara, et al.
Microscopy (Oxford, England)|October 1, 2020
Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning methodShigeto Yamasaki, Misaki Deguchi, Masatoshi Mitsuhara, et al.
Nanotechnology|December 7, 2016
X-ray photoelectron spectroscopy and transmission electron microscopy analysis of silver-coated gold nanorods designed for bionanotechnology applicationsFumiya Watanabe, Zeid A Nima, Takumi Honda, et al.
Scientific Reports|October 27, 2021
Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filteringYifang Zhao, Suguru Koike, Rikuto Nakama, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 28, 2011
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films: an electron tomography and aberration-corrected high-resolution ADF-STEM studyHosni Idrissi, Stuart Turner, Masatoshi Mitsuhara, et al.
Nature Communications|February 1, 2023
Grain refinement in titanium prevents low temperature oxygen embrittlementYan Chong, Reza Gholizadeh, Tomohito Tsuru, et al.
Microscopy (Oxford, England)|March 3, 2020
Electron tomography imaging methods with diffraction contrast for materials researchSatoshi Hata, Hiromitsu Furukawa, Takashi Gondo, et al.
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