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Analytical Chemistry|July 16, 2020
A Correlative ToF-SIMS/SPM Methodology for Probing 3D DevicesValentina Spampinato, Masoud Dialameh, Alexis Franquet, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2024
Influence of the Emitter Shape on the Field-of-View in Atom Probe TomographyMasoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, et al.
Scientific Reports|July 29, 2018
Influence of the long-range ordering of gold-coated Si nanowires on SERSEleonora Cara, Luisa Mandrile, Federico Ferrarese Lupi, et al.
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