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Ultramicroscopy|August 24, 2016
Surface topography analysis with application of roughness area dependence methodAdam Szyszka, Mateusz Wośko, Tomasz Szymański, et al.
Nanomaterials (Basel, Switzerland)|December 10, 2025
Thermal Stability of Thin Metal Films on GaN Surfaces: Morphology and NanostructuringAndrzej Stafiniak, Wojciech Macherzyński, Adam Szyszka, et al.
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