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Matteo Buffolo

Showing results (1-10 of 9) with videos related to

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Materials (Basel, Switzerland)|March 6, 2021
Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative Lifetime and Extraction of Defect CharacteristicsMatteo Buffolo, Alessandro Magri, Carlo De Santi, et al.
Materials (Basel, Switzerland)|October 12, 2017
Laser-Based Lighting: Experimental Analysis and PerspectivesNicola Trivellin, Maksym Yushchenko, Matteo Buffolo, et al.
Micromachines|August 26, 2022
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting DiodeClaudia Casu, Matteo Buffolo, Alessandro Caria, et al.
Materials (Basel, Switzerland)|August 30, 2018
Reliability of Blue-Emitting Eu<sup>2+</sup>-Doped Phosphors for Laser-Lighting ApplicationsMatteo Buffolo, Carlo De Santi, Marco Albertini, et al.
Micromachines|April 30, 2021
Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p<sup>+</sup>n<sup>-</sup>n Diodes: The Road to Reliable Vertical MOSFETsKalparupa Mukherjee, Carlo De Santi, Matteo Buffolo, et al.
Materials (Basel, Switzerland)|May 5, 2021
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Spherical Irradiation Box: Design, Characterization and ValidationNicola Trivellin, Matteo Buffolo, Francesco Onelia, et al.
Materials (Basel, Switzerland)|May 5, 2021
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack OptimizationKalparupa Mukherjee, Carlo De Santi, Matteo Borga, et al.
Scientific Reports|April 18, 2025
Modeling the capacitance-voltage characteristics of AlGaN-based UV-C LEDsNicola Roccato, Francesco Piva, Matteo Buffolo, et al.
Scientific Reports|November 12, 2025
Diffusion mechanism as cause of optical degradation in AlGaN-based UV-C leds investigated by TCAD simulationsNicola Roccato, Francesco Piva, Matteo Buffolo, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Materials (Basel, Switzerland)|March 6, 2021
Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative Lifetime and Extraction of Defect CharacteristicsMatteo Buffolo, Alessandro Magri, Carlo De Santi, et al.
Materials (Basel, Switzerland)|October 12, 2017
Laser-Based Lighting: Experimental Analysis and PerspectivesNicola Trivellin, Maksym Yushchenko, Matteo Buffolo, et al.
Micromachines|August 26, 2022
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting DiodeClaudia Casu, Matteo Buffolo, Alessandro Caria, et al.
Materials (Basel, Switzerland)|August 30, 2018
Reliability of Blue-Emitting Eu<sup>2+</sup>-Doped Phosphors for Laser-Lighting ApplicationsMatteo Buffolo, Carlo De Santi, Marco Albertini, et al.
Micromachines|April 30, 2021
Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p<sup>+</sup>n<sup>-</sup>n Diodes: The Road to Reliable Vertical MOSFETsKalparupa Mukherjee, Carlo De Santi, Matteo Buffolo, et al.
Materials (Basel, Switzerland)|May 5, 2021
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Spherical Irradiation Box: Design, Characterization and ValidationNicola Trivellin, Matteo Buffolo, Francesco Onelia, et al.
Materials (Basel, Switzerland)|May 5, 2021
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack OptimizationKalparupa Mukherjee, Carlo De Santi, Matteo Borga, et al.
Scientific Reports|April 18, 2025
Modeling the capacitance-voltage characteristics of AlGaN-based UV-C LEDsNicola Roccato, Francesco Piva, Matteo Buffolo, et al.
Scientific Reports|November 12, 2025
Diffusion mechanism as cause of optical degradation in AlGaN-based UV-C leds investigated by TCAD simulationsNicola Roccato, Francesco Piva, Matteo Buffolo, et al.
Pageof 1