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Optics Letters
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February 15, 2020
Precise length definition of active GaAs-based optoelectronic devices for low-loss silicon photonics integration
Heidi Tuorila, Jukka Viheriälä, Nouman Zia, et al.
ACS Omega
|
August 5, 2024
On-Chip Polarization Rotators Using Metasurface
Dura Shahwar, Markku Kapulainen, Tomi Haatainen, et al.
Optics Letters
|
June 2, 2020
Compact multi-million Q resonators and 100 MHz passband filter bank in a thick-SOI photonics platform
Bohan Zhang, Kenaish Al Qubaisi, Matteo Cherchi, et al.
Optics Letters
|
October 15, 2015
Silicon wavelength-selective partial-drop broadcast filter bank
Zhan Su, Matteo Cherchi, Erman Timurdogan, et al.
3D Printing and Additive Manufacturing
|
October 3, 2024
3D Printed Lenses for Vertical Beam Collimation of Optical Phased Arrays
Sidra Tul Muntaha, Ari Hokkanen, Mikko Harjanne, et al.
Optics Express
|
March 14, 2013
Method for characterization of Si waveguide propagation loss
Michele Moresco, Marco Romagnoli, Stefano Boscolo, et al.
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of 2
Search research articles
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Showing results (11-20 of 16) with videos related to
Sort By:
Page
of 2
You have reached the last page of results.
This site can display upto 16 results.
Optics Letters
|
February 15, 2020
Precise length definition of active GaAs-based optoelectronic devices for low-loss silicon photonics integration
Heidi Tuorila, Jukka Viheriälä, Nouman Zia, et al.
ACS Omega
|
August 5, 2024
On-Chip Polarization Rotators Using Metasurface
Dura Shahwar, Markku Kapulainen, Tomi Haatainen, et al.
Optics Letters
|
June 2, 2020
Compact multi-million Q resonators and 100 MHz passband filter bank in a thick-SOI photonics platform
Bohan Zhang, Kenaish Al Qubaisi, Matteo Cherchi, et al.
Optics Letters
|
October 15, 2015
Silicon wavelength-selective partial-drop broadcast filter bank
Zhan Su, Matteo Cherchi, Erman Timurdogan, et al.
3D Printing and Additive Manufacturing
|
October 3, 2024
3D Printed Lenses for Vertical Beam Collimation of Optical Phased Arrays
Sidra Tul Muntaha, Ari Hokkanen, Mikko Harjanne, et al.
Optics Express
|
March 14, 2013
Method for characterization of Si waveguide propagation loss
Michele Moresco, Marco Romagnoli, Stefano Boscolo, et al.
Page
of 2